2006
DOI: 10.1016/j.mejo.2006.07.013
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Classical capacitance of few-electron dielectric spheres

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Cited by 12 publications
(3 citation statements)
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“…In a classical electrostatic model where the carriers are described by point charges that are free to move inside a dielectric sphere, 21 Coulomb repulsion leads to localization of the injected carriers near the surface of the quantum dot. In our quantum-mechanical calculations, carrier localization is determined by the spatial localization of the single-particle wave functions and by the mixing of different configurations via configuration interaction.…”
Section: B Charge Distribution Of the Injected Carriersmentioning
confidence: 99%
“…In a classical electrostatic model where the carriers are described by point charges that are free to move inside a dielectric sphere, 21 Coulomb repulsion leads to localization of the injected carriers near the surface of the quantum dot. In our quantum-mechanical calculations, carrier localization is determined by the spatial localization of the single-particle wave functions and by the mixing of different configurations via configuration interaction.…”
Section: B Charge Distribution Of the Injected Carriersmentioning
confidence: 99%
“…For this reason, this work can be of interest to a wide audience of physics educators [31] as well as some researchers working on the field of electrostatics [32][33][34] or opto-electronic materials [35,36]. In particular, we believe that the results reported in this work would be of great interest to undergraduate students and university teachers, because this problem illustrates very well key concepts of electrostatics involving a wide range of mathematical tools (special functions, expansions, infinite sums and numerical calculations).…”
Section: Discussionmentioning
confidence: 99%
“…The development of micro-scale engineering in the area of electrical and computer engineering demonstrates technology advancements in low cost, high efficiency, and miniaturization. The understanding of the structure and properties of materials, coupled with system-driven design, fabrication, and optimization of materials, leads to the development and exploitation of new materials and devices for future microand nano-systems 2 . Reliable modeling and simulation are the basis for understanding and optimization of materials and structures of devices, and the basis for development of the emerging nanoelectronic devices.…”
Section: Nano Device Simulation Projectmentioning
confidence: 99%