1990
DOI: 10.1007/bf02651746
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Cl2 chemical dry etching of GaAs under high vacuum conditions—Crystallographic etching and its mechanism

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Cited by 44 publications
(11 citation statements)
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“…This agrees with the findings of Furuhata et al [6] that the etch rate of the (110) cleavage planes is the same as that of the (100) planes.…”
Section: Methodssupporting
confidence: 94%
“…This agrees with the findings of Furuhata et al [6] that the etch rate of the (110) cleavage planes is the same as that of the (100) planes.…”
Section: Methodssupporting
confidence: 94%
“…The etch rates at the end points are 30, 20, 20, and 0 nm/min for ͕111͖B, ͕001͖, ͕011͖, and ͕111͖A surfaces, respectively, consistent with Ref. 8. The remaining free parameter of the parabolic function R() for each grating orientation was obtained by fitting simulated grating shapes to the experimental ones.…”
supporting
confidence: 66%
“…In fact, the following etch rate sequence has been measured by Furuhata et al 8 for different substrate orientations: ͕111͖BϾ͕011͖ϭ͕001͖Ͼ͕111͖A. The sidewalls of our wet etched gratings have angles of 30°Ϯ5°w ith respect to the ͑001͒ surface and thus do not correspond to low-index crystal facets.…”
mentioning
confidence: 74%
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“…8 This is because the desorption rate of Ga chlorides is lower than that of As chlorides. 8 This is because the desorption rate of Ga chlorides is lower than that of As chlorides.…”
Section: Resultsmentioning
confidence: 99%