DOI: 10.1109/date.2004.1269073
View full text
|
|
Share

Abstract: ABSTRACTScan-based designs are widely used to decrease the complexity of the test generation process; nonetheless, they increase test time and volume. A new scan architecture is proposed to reduce test time and volume while retaining the original scan input count. The proposed architecture allows the use of the captured response as a template for the next pattern with only the necessary bits of the captured response being updated while observing the full captured response. The theoretical and experimental ana…

expand abstract