2010
DOI: 10.1063/1.3493047
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Circularly polarized luminescence microscopy for the imaging of charge and spin diffusion in semiconductors

Abstract: Room temperature electronic diffusion is studied in 3 m thick epitaxial p+ GaAs lift-off films using a novel circularly polarized photoluminescence microscope. The method is equivalent to using a standard optical microscope and provides a contactless means to

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Cited by 43 publications
(64 citation statements)
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“…Curve a, taken at the same low power as Fig. 1, reveals the expected polarization decrease caused by spin-lattice relaxation during transport [17]. Note that the low power electronic polarization at r = 0, P lp (0) = 45 % is almost equal to the initial polarization P i .…”
Section: A Methodsmentioning
confidence: 83%
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“…Curve a, taken at the same low power as Fig. 1, reveals the expected polarization decrease caused by spin-lattice relaxation during transport [17]. Note that the low power electronic polarization at r = 0, P lp (0) = 45 % is almost equal to the initial polarization P i .…”
Section: A Methodsmentioning
confidence: 83%
“…1 and has been presented in more detail elsewhere [17]. Circularly-polarized light excitation at 1.59 eV is focused to a Gaussian spot of half width ω = 0.6 µm.…”
Section: A Methodsmentioning
confidence: 99%
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“…1). The sample is excited at its center by a tightly-focused laser along the z direction such that steady-state imaging of the luminescence intensity enables us to monitor the diffusion profile of minority carriers 10 . The resulting profiles are interpreted using two distinct and complementary approaches: i) a numerical resolution of the coupled diffusion equations for electrons and holes, and ii) a simple qualitative estimate of the electron concentration at the center which yields the power dependence of the luminescence thereby permitting D a to be evaluated as a function of photo- electron concentration.…”
Section: Introductionmentioning
confidence: 99%