Circular-path polarization point-diffraction interferometer and analysis of the fringe parameters

Xu, Yun; Wang, Ying; Liu, Zhen; Wang, Xiaoqiang

doi:10.1016/j.ijleo.2018.01.002

Cited by 5 publications

(2 citation statements)

References 21 publications

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“…A modified Sagnac interferometer based on multiple phasestep algorithms have been realized, such as, the replication of the output with two coupling interferometric arrangements [1], or by adjusting a beam splitter (BS) in the cyclic arrangement [2]. It was reported that an analyzer at the interferometer's output must be rotated to employ this phase shift approach.…”

Section: Introductionmentioning

confidence: 99%

The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

Usman¹,

Jiraraksopakun²,

Kaewon³

et al. 2022

Laser Phys.

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This paper presents the comparison of three-, four- and five-step techniques for measuring transparent thin-film thickness of T a 2 O 5 and W O 3 deposited on BK-7 substrates. The Sagnac interferometer was modified with phase shifting approach for the determination of thin-film thickness. The input light beam was split into reference and testing beams. Before the output light reaching the balanced photodetectors, the real-time signal detection was performed to obtain the output intensities of both beams using three-, four-, and five-polarization settings of an analyzer. The thicknesses could then be efficiently translated from the measured intensities. Thicknesses from three-, four- and five-stepping algorithms were compared with ones from the conventional FE-SEM measurement, and it was discovered that the former performed better with less errors. The findings show that the phase-shifting technique using three-polarization settings is more suitable for the thickness measurement of the transparent thin film.

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Section: Introductionmentioning

confidence: 99%

The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

Usman¹,

Jiraraksopakun²,

Kaewon³

et al. 2022

Laser Phys.

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show abstract

“…Therefore, researchers go to great lengths to design an interferometer with ideal fringe visibility. In our previous works, two self-referencing interferometers respectively based on point diffraction and radial shearing structures have been built [10,11], in which the circular path structure is used to realize common-path interference and the wavefront phase is extracted with phase-shifting technique or Fourier transform method. The most attractive advantage of these interferometers is that the fringe visibility is adjustable and it is especially important to high accuracy measurement of interferometers.…”

Section: Introductionmentioning

confidence: 99%

Estimation technique of global fringe visibility using in interferometers with adjustable visibility

bai

Chen

Gao

et al. 2020

Preprint

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In the accuracy measurement of phase from interferometers with adjustable fringe visibility, it needs to estimate the visibility of experimental patterns so as to obtain the interference patterns with the maximum visibility. We develop the Fourier-polar transform and combine the directional projection to estimate the global visibility of carrier fringe pattern. The technique is especially used for low-quality fringe pattern such as low contrast and low (signal to noise ratio) SNR that often appear in the interferometric experiment. An illustrative experiment based on the radial shearing interferometer is given. Results generated from this technique are compared with the derived values from theoretical model, and exemplary agreement between both is demonstrated.

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Comparative Studies of Circularly Polarized Light with Phase Shift in Sagnac and Mach-Zehnder Interferometers

Usman,

Muhammad,

Jiraraksopakun

et al. 2024

Russ Phys J

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Circular-path polarization point-diffraction interferometer and analysis of the fringe parameters

Cited by 5 publications

References 21 publications

The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

Estimation technique of global fringe visibility using in interferometers with adjustable visibility

Comparative Studies of Circularly Polarized Light with Phase Shift in Sagnac and Mach-Zehnder Interferometers

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