Circuit Techniques for BTI and EM Accelerated and Active Recovery

Guo, Xinfei; Stan, Mircea R.

doi:10.1007/978-3-030-20051-0_4

Cited by 5 publications

(3 citation statements)

References 42 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…1) BIAS TEMPERATURE INSTABILITY (BTI) -BTI relates to the transistor's threshold voltage (Vth) increase and the carrier mobility (µ) decrease [22]. This causes to increase in circuit delay, which eventually leads to timing faults.…”

Section: B Aging In Modern Integrated Circuitsmentioning

confidence: 99%

See 1 more Smart Citation

Dependable DNN Accelerator for Safety-Critical Systems: A Review on the Aging Perspective

Moghaddasi,

Gorgin,

Lee

2023

IEEE Access

View full text Add to dashboard Cite

Nowadays, artificial intelligence (AI) and deep learning (DL) progressively adapt to various spheres of our lives. These disciplines contain safety-critical applications such as autonomous driving with a high risk of human injury in the case of malfunction, requiring a high promise of dependability. Even the dependability becomes more crucial as shrinking CMOS technology feature size worsens the resilience concerns due to factors like aging. This paper addresses the overarching dependability issue of advanced deep neural networks (DNN) accelerators from the aging perspective. Especially, a comprehensive survey and taxonomy of techniques used to evaluate and mitigate aging effects are introduced. We cover different aging effects like permanent faults, timing errors, and lifetime issues. We review research by the layer-wise approach and categorize several resilience classes to bring out major features. The concluding part of this review highlights the questions answered and several future research directions. This study is expected to benefit researchers in different areas of DNN deployment, especially the dependability of this emergent paradigm.

show abstract

Section: B Aging In Modern Integrated Circuitsmentioning

confidence: 99%

“…This creates atomic lattice distortions, reduces conductivity, and potentially forms atomic voids. As a result, conductors typically become permanently damaged, eventually, cause to open circuit failure [22].…”

Section: ) Time-dependent Dielectric Breakdown (Tddbmentioning

confidence: 99%

Dependable DNN Accelerator for Safety-Critical Systems: A Review on the Aging Perspective

Moghaddasi,

Gorgin,

Lee

2023

IEEE Access

View full text Add to dashboard Cite

show abstract

“…Therefore, aggressive transistor downscaling causes unavoidable reliability issues in modern integrated circuits (IC). On the one hand, among all the reliability issues, the aging effects such as bias temperature instability (BTI) [1]- [3] and hot carrier injection (HCI) [4]- [6] manifest themselves as an increase in the absolute threshold voltage (V th ) and reduction in the carrier mobility (µ), thus gradually degrading circuit performance [7], [8]. On the other hand, there are booming demand of high reliability circuits in the markets of autonomous vehicles, space operations and biomedical electronics.…”

Section: Introductionmentioning

confidence: 99%

Development and Challenges of Reliability Modeling From Transistors to Circuits

Yang

Sang

Wang

et al. 2023

IEEE J. Electron Devices Soc.

View full text Add to dashboard Cite

The integration density of electronic systems is limited by the reliability of the integrated circuits. To guarantee the overall performance, the integrated circuit reliability must be modeled and analyzed at the early design stage. This paper reviews some of the most important intrinsic aging mechanisms of MOSFETs and elaborates the physical mechanism of the coupling between aging effects. Then the progress in reliability modeling under static and dynamic operational voltages is reviewed. It is found that although these models can accurately predict the degradation in short term, they are with large errors for the long-term degradation prediction. Besides, for the circuit-level reliability modeling and simulation approach, there are still problems to be solved. This article aims to provide guidance for researchers and practitioners in integrated circuit field, and highlight the challenges for reliability research. It is of great significance to the optimization of the reliability of integrated circuits.

show abstract