In this work, the X-ray diffraction (XRD) measurement have been done to study the structure of K 2 CrO 4 , and K 2 Cr 2 O 7 powders.The morphology of K 2 CrO 4 , and K 2 Cr 2 O 7 thin films has been studied by using Atomic Force Microscopy (AFM) technique. Modes of vibrations for both K 2 CrO 4 , and K 2 Cr 2 O 7 compounds were measured and discussed using Fourier transform infrared spectroscopy (FTIR).