2006
DOI: 10.1021/ja055408g
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Chlorination−Methylation of the Hydrogen-Terminated Silicon(111) Surface Can Induce a Stacking Fault in the Presence of Etch Pits

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Cited by 29 publications
(45 citation statements)
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References 15 publications
(29 reference statements)
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“…Results for larger chain alkyls indicate that complete coverage is not possible. 27,35 As previously noted by Solares et al 27 and in our previous work, 36 the dihedral angle adopted by the surface methyl groups results from a balance between the steric repulsion of the hydrogen atoms and the torsional strain of the methyl groups with respect to the underlying silicon surface. This balance of forces will be discussed in detail ͑vide infra͒.…”
Section: Introductionsupporting
confidence: 62%
See 1 more Smart Citation
“…Results for larger chain alkyls indicate that complete coverage is not possible. 27,35 As previously noted by Solares et al 27 and in our previous work, 36 the dihedral angle adopted by the surface methyl groups results from a balance between the steric repulsion of the hydrogen atoms and the torsional strain of the methyl groups with respect to the underlying silicon surface. This balance of forces will be discussed in detail ͑vide infra͒.…”
Section: Introductionsupporting
confidence: 62%
“…[19][20][21][22][23][24][25][26] Recently, organic functionalization involving a two-step chlorination/alkylation has been improved by Lewis and co-workers. [27][28][29] Methyl passivation was found to be effective using a two-step chlorination/ methylation with the Grignard reagent. The resulting surface has been characterized using several experimental methods by Fidelis et al, 30 Yamada et al, 31,32 and by Webb et al 33,34 Methyl passivation stabilizes the silicon ͑111͒ surface to oxidation for long periods of atmospheric exposure ͑Ͼ600 h͒.…”
Section: Introductionmentioning
confidence: 99%
“…threshold. The optimized structure calculated for both CH 3 -Si(111) and CD 3 The dihedral angle H-C-Si-Si, which defines the orientation of the surface methyl groups, was found to be 37.7 • , which is in excellent agreement with the value (38 • ) obtained by Solares et al 31 using the PBE exchange-correlation functional and by Ferguson et al 20 using the Heyd-ScuseriaErnzerhof (HSE) hybrid functional.…”
Section: Density Functional Perturbation Theory Computational Detailssupporting
confidence: 80%
“…It is likely that the edges and steps are also passivated, possibly by H, if not by -CH 3 groups. 13 The large conductance gap relative to the Si band gap was observed for both the methyl-and ethyl-terminated Si͑111͒ surfaces prepared by the two-step chlorination/ alkylation method. We ascribe this behavior to tip-induced band bending ͑TIBB͒, as identified previously by McEllistrem et al 14 TIBB can only occur for surfaces with relatively low levels of midgap states, so that the bias applied between the tip and the sample drops across the sample, and the Fermi level of the sample becomes unpinned at the surface.…”
mentioning
confidence: 96%