Methyl-and ethyl-terminated Si͑111͒ surfaces prepared by a two-step chlorination/alkylation method were characterized by low temperature scanning tunneling spectroscopy ͑STS͒. The STS data showed remarkably low levels of midgap states on the CH 3 -and C 2 H 5 -terminated Si surfaces. A large conductance gap relative to the Si band gap was observed for both surfaces as well as for the hydrogen-terminated Si͑111͒ surface. This large gap is ascribed to scanning tunneling microscope tip-induced band bending resulting from a low density of midgap states which avoid pinning of the Fermi levels on these passivated surfaces. © 2006 American Institute of Physics. ͓DOI: 10.1063/1.2203968͔Alkylation of Si by a two-step chlorination/alkylation process 1 has been shown to produce surfaces that are passivated both chemically and electrically. 2,3 In common with H-terminated Si surfaces, the alkylated surfaces show extraordinarily low surface recombination velocities. 2,3 However, unlike H-Si͑111͒ surfaces, alkylated surfaces are not susceptible to rapid oxidation in ambient air and do not suffer concomitant degradation of their surface electrical properties. 2,3 Alkylation of Si͑111͒ with methyl groups has been shown by low-energy electron diffraction 4 ͑LEED͒ to produce surfaces with long-range order and by scanning tunneling microscopy ͑STM͒ to produce surfaces with shortrange order. 5,6 Additionally, photoemission and work function measurements 4 in ultrahigh vacuum have shown that CH 3 -terminated Si samples have relatively little band bending, consistent with a low density of band-gap states and in contrast to the fixed charge that is universally present at Si/ SiO 2 interfaces.We report herein scanning tunneling spectroscopy ͑STS͒ data for H-, CH 3 -, and C 2 H 5 -terminated Si͑111͒ surfaces. To date, the only wet chemically prepared Si surface reported to exhibit nearly ideal STS behavior is the H-Si͑111͒ surface. 7 Interestingly, in ultrahigh vacuum ͑UHV͒, this surface exhibits a tunneling gap of Ͼ1.6 eV in which little or no midgap conductance is observed, 8 whereas the band gap of Si is 1.1 eV. The tunneling behavior of CH 3 -Si͑111͒ and C 2 H 5 -Si͑111͒ is thus interesting in this context, given the low midgap density of states expected for such alkylated Si surfaces from macroscopic measurements of such systems. 2,3 Silicon surfaces were functionalized using a two-step chlorination/alkylation procedure. 1 Samples were obtained from ͑111͒-oriented, Sb-doped, 0.005-0.02 ⍀ cm resistivity, n-type Si wafers having a miscut error of ±0.5°. The samples were cleaned and oxidized for 5 min at 80°C in a solution of 1:1:5 ͑vol͒ 30% H 2 O 2 : 30% NH 3 : H 2 O and were then terminated with Si-H bonds by etching for 15 min in 40% NH 4 F͑aq͒. This etching method has been demonstrated to produce large atomically flat terraces. 5 Chlorination was performed by exposure of the samples to a solution of PCl 5 in chlorobenzene. 3,9 A small amount of benzoyl peroxide was added to initiate a radical reaction, and the samples were heated ...