“…17 Here, to gain insight into this effect, we focus on one other type of skyrmion aggregate, that is, an array of skyrmion rows stretching in the plane of strained MnSi thin films with an in-plane H. 18 Epitaxial MnSi(111) thin films on Si substrates receive a tensile strain due to the lattice mismatch, which increases the hardaxis uniaxial anisotropy along the direction normal to the film plane. 19 Detection of such an in-plane skyrmion formation, however, is challenging experimentally because the established detection methods, such as Lorentz transmission microscopy (TEM) and topological Hall effect, 20,21 are difficult to be applied, in principle, for an in-plane H configuration. Thus far, the formation of the in-plane skyrmion [ Fig.…”