Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) 2003
DOI: 10.1109/epep.2003.1249999
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Chip-package co-design of common emitter LNA in system-on-package with on-chip versus off-chip passive component analysis

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Cited by 9 publications
(7 citation statements)
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“…The statistics of those parameters (including variation range, distribution function, etc) are also collected and are appended to the initial models of the components. The circuits are designed with these components [9].Statistical responses of the components and the RF SoP modules are studied through Monte Carlo method. If the yield of the circuits obtained from the statistical analysis is not good enough, optimization of the circuits should be implemented in next step.…”
Section: Statistical Modeling and Improvement For Rf Designmentioning
confidence: 99%
“…The statistics of those parameters (including variation range, distribution function, etc) are also collected and are appended to the initial models of the components. The circuits are designed with these components [9].Statistical responses of the components and the RF SoP modules are studied through Monte Carlo method. If the yield of the circuits obtained from the statistical analysis is not good enough, optimization of the circuits should be implemented in next step.…”
Section: Statistical Modeling and Improvement For Rf Designmentioning
confidence: 99%
“…A co-design methodology used in the research SSN noise and the effect of decoupling capacitor to the PDN system, through the signal path, the signal transmission distance and PVT(process, voltage and temperature)study, elaborated Chip-Package-PCB co-analysis the feasibility of the method [2]. Another chippackage co-design method to study the mixed-signal circuit to considering the impact of the package's on the overall system performance to improving the accuracy and efficient of the analysis [3] [4]. Use of chip-package-PCB co-analysis method to study the SI and PI problem of high-speed DDR3 system, by modeling the command / address line, and a fly-by topology method to analysis the command / address line of discontinuity and SI problem; meanwhile, modeling of PDN and comprehensive analysis of the data bus SSN [5].…”
Section: Introductionmentioning
confidence: 99%
“…Due to technical limitation, feature size of conductors are at 100-400um. In the second method, we use the same approach as our in-house developed SoP technology with embedded chip in LCP substrate [12][13][14][15][16]. This is a deposition and lithography based technology in which photo-BCB are coated via pin-off technique for interlayer conductor isolation and vias are etched for interlayer interconnection.…”
Section: B System Integration Issuesmentioning
confidence: 99%