2014
DOI: 10.1016/j.vacuum.2014.03.003
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Chemistry studies of SF6/CF4, SF6/O2 and CF4/O2 gas phase during hollow cathode reactive ion etching plasma

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Cited by 19 publications
(10 citation statements)
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“…This experiment showed that~30% of the gas ratio had a maximum etch rate. Tezani et al reported on the chemistry of plasmas generated with SF 6 and CF 4 mixtures or mixed separately with O 2 [27]. Their experiment showed similar results.…”
Section: Resultsmentioning
confidence: 81%
See 1 more Smart Citation
“…This experiment showed that~30% of the gas ratio had a maximum etch rate. Tezani et al reported on the chemistry of plasmas generated with SF 6 and CF 4 mixtures or mixed separately with O 2 [27]. Their experiment showed similar results.…”
Section: Resultsmentioning
confidence: 81%
“…Many studies have reported on the RIE parameters for controlling the etching rate with the O 2 /SF 6 gas ratio [26,27]. For example, Knizikevi cius showed the influence of adding O 2 to SF 6 plasma on the etching rate of Si [26].…”
Section: Resultsmentioning
confidence: 99%
“…These parameters are typical for the negative ion sources. [1][2][3][4][5][6][7][8][9][10][11][12] Two cases are studied, namely, with and without the application of a homogeneous magnetic field. In the first case, magnetic field lines are parallel to the electrodes.…”
Section: Numerical Modelmentioning
confidence: 99%
“…SF 6 plasma is commonly used as the main reactive agent to etch silicon due to its capacity to generate atomic fluorine (F), which has a high affinity for Si atoms to form SiF x ( x = ¼, 2, 4) volatile species [18,19]. The addition of small concentrations of O 2 in the SF 6 plasma leads to the generation of F due to the following oxidation reaction: O + SF x → SOF x −1 + F ( x ≤ 5) [18].…”
Section: Introductionmentioning
confidence: 99%
“…SF 6 plasma is commonly used as the main reactive agent to etch silicon due to its capacity to generate atomic fluorine (F), which has a high affinity for Si atoms to form SiF x ( x = ¼, 2, 4) volatile species [18,19]. The addition of small concentrations of O 2 in the SF 6 plasma leads to the generation of F due to the following oxidation reaction: O + SF x → SOF x −1 + F ( x ≤ 5) [18]. To our knowledge, the best aspect ratios (as high as 107) have been achieved using deep RIE (DRIE) [20], and values of 50 have been reported using Inductively Coupled Plasma (ICP-RIE) [21].…”
Section: Introductionmentioning
confidence: 99%