2003
DOI: 10.1016/s0167-9317(02)00944-9
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Chemical vapor deposition of copper thin films for multi-level interconnections

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Cited by 12 publications
(12 citation statements)
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“…9,11,12 It is associated with free-electron scattering at external surfaces and higher grain density resulting in internal free-electron scattering at grain boundaries, as well as other minor factors as inhomogeneous film growth, decreased island growth, surface roughness, impurities, and poor film crystallinity. 4,[12][13][14][15][16] Indeed, previous works have shown that the resistivity of copper thin films increases from bulk value to several lX cm when the layers are in the a) Electronic mail: felipe.cemin@u-psud.fr nanoscale range. 3,5,10,[17][18][19] Therefore, the understanding and control of this size-dependent phenomenon is a major concern and a key issue to the entire microelectronics industry, since copper is expected to continue dominating the interconnect technology.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…9,11,12 It is associated with free-electron scattering at external surfaces and higher grain density resulting in internal free-electron scattering at grain boundaries, as well as other minor factors as inhomogeneous film growth, decreased island growth, surface roughness, impurities, and poor film crystallinity. 4,[12][13][14][15][16] Indeed, previous works have shown that the resistivity of copper thin films increases from bulk value to several lX cm when the layers are in the a) Electronic mail: felipe.cemin@u-psud.fr nanoscale range. 3,5,10,[17][18][19] Therefore, the understanding and control of this size-dependent phenomenon is a major concern and a key issue to the entire microelectronics industry, since copper is expected to continue dominating the interconnect technology.…”
Section: Introductionmentioning
confidence: 99%
“…9,11 Most copper thin films are grown by physical vapor deposition (PVD) processes, in particular, by conventional direct current magnetron sputtering (DCMS), [2][3][4]17,[20][21][22] and by metal-organic chemical vapor deposition (MOCVD). 15,[23][24][25] Compared to the conventional PVD processes, the copper films deposited by CVD exhibit a better step coverage and higher deposition rates. However, MOCVD requires a complicated processing system with the use of metal organic compounds, higher deposition temperatures ($180-400 C), and the need of a postannealing process to improve the thin film smoothness, crystallinity, and electromigration.…”
Section: Introductionmentioning
confidence: 99%
“…ing [19]. Additionally, the copper-deposited wet-etched grating can be mounted on a heat sink to dissipate the heat.…”
Section: Particle-in-cell Simulation Modelmentioning
confidence: 99%
“…In SCFD, the use of scCO 2 as a solvent overcomes several limitations in vacuum-based processes. For example, solubility of precursors due to the liquid-like property of scCO 2 increases the variety of applicable precursors [11], while there are only few precursors for Cu-CVD due to low volatility of Cu compounds [12][13][14][15][16][17][18][19][20][21][22]. The use of scCO 2 also has numerous advantages inherent in the physical properties of scCO 2 intermediate between liquid and gas.…”
Section: Introductionmentioning
confidence: 99%