“…9,11,12 It is associated with free-electron scattering at external surfaces and higher grain density resulting in internal free-electron scattering at grain boundaries, as well as other minor factors as inhomogeneous film growth, decreased island growth, surface roughness, impurities, and poor film crystallinity. 4,[12][13][14][15][16] Indeed, previous works have shown that the resistivity of copper thin films increases from bulk value to several lX cm when the layers are in the a) Electronic mail: felipe.cemin@u-psud.fr nanoscale range. 3,5,10,[17][18][19] Therefore, the understanding and control of this size-dependent phenomenon is a major concern and a key issue to the entire microelectronics industry, since copper is expected to continue dominating the interconnect technology.…”