Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface

Bamidele, Joseph; Kinoshita, Yukinori; Turanský, Robert; Lee, Seung Hwan; Naitoh, Yoshitaka; Li, Y. J.; Sugawara, Yasuhiro; Štich, Ivan; Kantorovich, Lev

doi:10.1103/physrevb.86.155422

Cited by 25 publications

(43 citation statements)

References 48 publications

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“…When placing a single Cu adatom on the p(2 Â 1) reconstructed surface, we find in our DFT simulations that the Cu atom occupies the 'super'-Cu position, which is very similar to that on the c(6 Â 2) surface 12,19 (see Fig. 1a and Supplementary Information).…”

Section: Summary Of Main Resultsmentioning

confidence: 55%

“…We expect that the actual probabilities may be reduced. The simple tip model used in our study may also have some effect on the computed properties 12,16 . Nevertheless, keeping in mind the experimental limitations, the computed probabilities do agree with our experimental findings at least qualitatively.…”

Section: Summary Of Main Resultsmentioning

confidence: 99%

“…At the experimental oxygen exposures the oxidized Cu(110) surface consists of p(2 Â 1) and c(6 Â 2) patches 12,16 . The p(2 Â 1) surface shown in Fig.…”

Section: Summary Of Main Resultsmentioning

confidence: 99%

“…For instance, if an atom is picked up vertically by the tip during the scan, only the initial part of a circular blob representing the atom is imaged, the rest is missing and the image is terminated by a straight line running along the fast imaging direction (a 'half-moon' image). In the opposite case of an atom being deposited from the tip to the surface, the final part of the circular blob shows up starting with a straight line along the fast imaging direction 12 . In fact, in most cases reported so far after such a vertical manipulation the whole contrast abruptly changes 12 as the tip apex structure changes significantly after the manipulation event.…”

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confidence: 99%

“…In the opposite case of an atom being deposited from the tip to the surface, the final part of the circular blob shows up starting with a straight line along the fast imaging direction 12 . In fact, in most cases reported so far after such a vertical manipulation the whole contrast abruptly changes 12 as the tip apex structure changes significantly after the manipulation event. Note that in the case of the lateral manipulation there are two spots of the manipulated atom on the same image: the first one shows the atom's initial position and is terminated abruptly (a 'half moon'), while the second one corresponds to the atom's new position.…”

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confidence: 99%

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Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

et al. 2014

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Manipulation is the most exciting feature of the non-contact atomic force microscopy technique as it allows building nanostructures on surfaces. Usually vertical manipulations are accompanied by an abrupt tip modification leading to a change of contrast. Here we report on low-temperature experiments demonstrating vertical manipulations of 'super'-Cu atoms on the p(2 Â 1) Cu(110):O surface, both extractions to and depositions from the tip, when the imaging contrast remains the same. These results are rationalized employing a novel and completely general method that combines density functional theory calculations for obtaining energy barriers as a function of tip height and a Kinetic Monte Carlo algorithm for studying the tip dynamics and extraction of manipulation statistics. The model reveals a novel multistep manipulation mechanism combining activated jumps of 'super'-Cu atoms to/from the tip with their drag by and diffusion on the tip.

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Section: Summary Of Main Resultsmentioning

confidence: 55%

Section: Summary Of Main Resultsmentioning

confidence: 99%

“…At the experimental oxygen exposures the oxidized Cu(110) surface consists of p(2 Â 1) and c(6 Â 2) patches 12,16 . The p(2 Â 1) surface shown in Fig.…”

Section: Summary Of Main Resultsmentioning

confidence: 99%

mentioning

confidence: 99%

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confidence: 99%

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Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

et al. 2014

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Scanning Probe Microscopy

Guo

2018

Springer Theses

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Lesson: Scanning Probe Microscopy: "feeling" what you can't see at the nanometer scale Standards:HS-PS1-3. Plan and conduct an investigation to gather evidence to compare the structure of substances at the bulk scale to infer the strength of electrical forces between particles.HS-PS2-6. Communicate scientific and technical information about why the molecular-level structure is important in the functioning of designed materials.HS-PS2-1. Analyze data to support the claim that Newton's second law of motion describes the mathematical relationship among the net force on a macroscopic object, its mass, and its acceleration.HS-ETS1-2. Design a solution to a complex real-world problem by breaking it down into smaller, more manageable problems that can be solved through engineering.

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Atomic species recognition on oxide surfaces using low temperature scanning probe microscopy

Min

Shi

et al. 2017

Applied Surface Science

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In scanning probe microscopy (SPM), the chemical properties and sharpness of the tips of the cantilever greatly influence the scanning of a sample surface. Variation in the chemical properties of the sharp tip apex can induce transformation of the SPM images. In this research, we explore the relationship between the tip and the structure of a sample surface using dynamic atomic force microscopy (AFM) on a Cu(110)-O surface under ultra-high vacuum (UHV) at low temperature (78 K). We observed two different c(6×2) phase types in which super-Cu atoms show as a bright spot when the tip apex is of O atoms and O atoms show as a bright spot when the tip apex is of Cu atoms. We also found that the electronic state of the tip has a serious effect on the resolution and stability of the sample surface, and provide an explanation for these phenomena. This technique can be used to identify atom species on sample surfaces, and represents an important development in the SPM technique.

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Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface

Cited by 25 publications

References 48 publications

Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

Scanning Probe Microscopy

Atomic species recognition on oxide surfaces using low temperature scanning probe microscopy

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