2005
DOI: 10.1002/chin.200537296
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Chemical Mapping of Polymer Microstructure Using Soft X‐Ray Spectromicroscopy

Abstract: Recently, synchrotron-based soft X-ray spectromicroscopy techniques have been applied to studies of polymer microstructure at the ∼50 nm spatial scale. Functional group based chemical speciation and quantitative mapping is provided by near edge X-ray absorption fine structure spectral (NEXAFS) contrast. The techniques, sample data, and analysis methods of scanning transmission X-ray microscopy (STXM) and X-ray photoemission electron microscopy (X-PEEM) are outlined. The capabilities of STXM are illustrated by … Show more

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Cited by 2 publications
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“…See Bluhm et al (2006) for a detailed description of this beamline. Protocols for data acquisition and processing can be found in Bluhm et al (2006) and Hitchcock (2001). Energy calibration for the C K-edge was performed using gaseous CO 2 ; quartz and gibbsite were used for Si K-edge and Al K-edge energy calibrations, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…See Bluhm et al (2006) for a detailed description of this beamline. Protocols for data acquisition and processing can be found in Bluhm et al (2006) and Hitchcock (2001). Energy calibration for the C K-edge was performed using gaseous CO 2 ; quartz and gibbsite were used for Si K-edge and Al K-edge energy calibrations, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…Comprehensive descriptions of the STXM beamline [50,51] and optics [52] are provided elsewhere. Briefly, X-rays from a bend magnet are focused by a toroidal mirror and a spherical grating monochromator selects X-rays of a specific energy with the coherence defined by one entrance and two orthogonal exit slits.…”
Section: Spectromicroscopy Backgroundmentioning
confidence: 99%