1961
DOI: 10.1149/1.2428090
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Chemical Etching of Silicon

Abstract: The etch rate of silicon in solutions of various compositions selected from the system HF , HNO3 , H2O , and HC2H3O2 has been investigated over the temperature range 0° to 50 °C. The activation energy of the etching process has been found to be different in the different composition regions. In the high HNO3 region values of about 4 kcal/mole have been observed and interpreted as characteristic of a diffusion governed reaction. In compositions containing H2O or HC2H3O2 diluents the activation energy… Show more

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Cited by 195 publications
(160 citation statements)
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“…Although present etchant is relatively fast compared to other etchants, it can produce a poor surface finish as reported in literature (Abott et al, 1993). Thus, Fast etched planes covered with irregularities such as microscopic pyramids (Schwartz and Robbin, 1961). The resolution of scanning tunneling microscope (STM) is direct consequence of the quantum mechanical tunneling between the tip and surface.…”
Section: Fig 2: Anisotropic Er Of Silicon With Its Arrhenius Plotmentioning
confidence: 88%
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“…Although present etchant is relatively fast compared to other etchants, it can produce a poor surface finish as reported in literature (Abott et al, 1993). Thus, Fast etched planes covered with irregularities such as microscopic pyramids (Schwartz and Robbin, 1961). The resolution of scanning tunneling microscope (STM) is direct consequence of the quantum mechanical tunneling between the tip and surface.…”
Section: Fig 2: Anisotropic Er Of Silicon With Its Arrhenius Plotmentioning
confidence: 88%
“…Taking out silicon atoms from its surface with time for a given temperature and concentration of KOH is not same for different plane orientations. Its flexibility is exploited to design microstructures and devices with fraction of micron resolution (Schwartz and Robbin, 1961) nowadays.…”
Section: Introductionmentioning
confidence: 99%
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“…The HNA etching solution is very aggressive and the etching rate is strongly dependent on the concentration and temperature of the acid. 76 A mixture of HNO 3 (69%) with HF (49%) in a ratio 2:1 gives etch rates of around 50 lm/min. 77 The aggressive etching characteristic of HNA solution reduces the range of masking layers that can be used.…”
Section: Wet Etchingmentioning
confidence: 99%
“…A simple two-step etching mechanism has been proposed [3][4][5]. In this model the formation of an intermediate SiO2 layer by nitric acid (Eq.…”
Section: Introductionmentioning
confidence: 99%