Chemical deposition of copper sulfide films in the surface of polyamide by the use of higher polythionic acids

Janickis, Vitalijus; Maciulevičiusė, Raimondas; Ivanauskas, Remigijus; Ancutienė, Ingrida

doi:10.1007/s00396-002-0732-x

Cited by 16 publications

(8 citation statements)

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“…Application of these copper sulfide layers depends on their properties, such as chemical composition, structure, and electrical conductivity. The properties of the obtained layers depend on the conditions of synthesis, the precursor of sulfur and their composition [9,10]. Compositions of these layers have been studied by XRD [11,12], FTIR [13], potentiometry [14], however, to our knowledge, investigations by XPS are lacking.…”

Section: Introductionmentioning

confidence: 99%

Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film

Krylova

Andrulevičius

2009

International Journal of Photoenergy

130

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Copper sulfide layers were formed on polyamide PA 6 surface using the sorption-diffusion method. Polymer samples were immersed for 4 and 5 h in 0.15 mol·dm −3 K 2 S 5 O 6 solutions and acidified with HCl (0.1 mol·dm −3 ) at 20 • C. After washing and drying, the samples were treated with Cu(I) salt solution. The samples were studied by UV/VIS, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) methods. All methods confirmed that on the surface of the polyamide film a layer of copper sulfide was formed. The copper sulfide layers are indirect band-gap semiconductors. The values of E bg are 1.25 and 1.3 eV for 4 h and 5 h sulfured PA 6 respectively. Copper XPS spectra analyses showed Cu(I) bonds only in deeper layers of the formed film, while in sulfur XPS S 2p spectra dominating sulfide bonds were found after cleaning the surface with Ar + ions. It has been established by the XRD method that, beside Cu 2 S, the layer contains Cu 1.9375 S as well. For PA 6 initially sulfured 4 h, grain size for chalcocite, Cu 2 S, was ∼35.60 nm and for djurleite, Cu 1.9375 S, it was 54.17 nm. The sheet resistance of the obtained layer varies from 6300 to 102 Ω/cm 2 .

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Section: Introductionmentioning

confidence: 99%

Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film

Krylova

Andrulevičius

2009

International Journal of Photoenergy

130

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“…A Cu(II/I) salt solution was made from crystalline CuSO 4 •5H 2 O and a reducing agent hydroquinone as described in [12,13]. It is a mixture of copper salts, containing 0.34 mol L -1 of Cu(II) and 0.06 mol L -1 of Cu(I) [12].…”

Section: Methodsmentioning

confidence: 99%

Comparison of the efficacy of sulfurization agents in decreasing the sheet resistance of polyamide and polyethylene with copper sulfide layers and influence of their compositions

et al. 2009

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Abstract:The process of obtaining semiconductive and electrical conductive layers of copper sulfides by the sorption -diffusion method on polymers (polyamide 6 and low density polyethylene) using solutions of potassium pentathionate, K 2 S 5 O 6 , and higher polythionic acids, H 2 S n O 6 (n = 21, 33), was investigated. The layers were characterized for compositional and electrical properties by X-ray diffraction (XRD) analysis and sheet resistance measurements. The thickness of copper sulfides layers on polyamide and polyethylene increased with increasing time of polymer sulfurization and varied from 10 to 43 μm. The variations of the sheet resistance of copper sulfides layers formed on the surface of polymers on sulfurization agent used, the conditions of sulfurization, chemical and phase composition of the obtained layers were established. Sheet resistance of copper sulfides layers decreases with increasing time of the duration of sulfurization and the number of sulfur atoms in the polythionate anion. The sheet resistance values for copper sulfide layers formed on the polyamide surface are much lower than those of Cu x S formed on the polyethylene surface. XRD showed the predomination of Cu x S phases with low x values.© Versita Warsaw and Springer-Verlag Berlin Heidelberg.

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“…Recently at the Department of Inorganic Chemistry the sorption-diffusion method of low density polyethylene (LDPE) modification by semiconductor and electrically conductive layers of Cu x S has been investigated. By means of this method, first of all, PE is saturated with sulphur treating with the solutions of higher polythionic acids, H 2 S n O 6 (n = 9-45) [18,19], and then it is treated with a water solution of copper (II/I) salts [20][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35].…”

Section: Introductionmentioning

confidence: 99%

Higher polythionic acids – the precursors for formation of thallium sulphide layers on polyethylene surface

Janickis¹,

Bružaitė²

2018

chemija

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The method of thallium sulphide thin films deposition on low density polyethylene (LDPE), based on applying solutions of higher polythionic acids (H2SnO6, n = 21, 33, 45), was developed and investigated. The concentration of sulphur in the LDPE film increases with the increase of temperature of higher polythionic acid solution and its sulphurity, as well as the duration of retention of LDPE in its solution is prolonged. The sulphur concentration in the PE film under the same duration of sulphurisation and repetition of treatment cycles insignificantly changes. When the sulphurised LDPE was treated with a thallium Tl(I) salt solution, sulphur present in the polymer reacts with thallium ions and the layers of thallium sulphides, TlxSy, of different composition are formed. The stoichiometric composition of the layer changes from Tl0.1S to Tl2.6S. The amount of thallium increases in the sulphide layers when the number of the cycles of LDPE sulphurisation in the H2S33O6 solution and treatment of sulphurised polymer with the Tl(I) salt solution is increased. The stoichiometric composition of TlxSy coats of one treatment cycle samples changes from Tl0.5S to Tl1.1S. The X-ray diffraction analysis of the polyethylene, treated with the solution of higher polythionic acid, H2S33O6, and then with the Tl(I) salt solution, confirmed the premise that on the LDPE surface the layers of thallium sulphides, TlxSy, were formed. Five phases of thallium sulphides were identified: TlS, Tl2S, Tl2S2, Tl4S3 and Tl2S5. The TlS phase prevailed in diffractograms. The chemical and phase composition of the TlxSy layers surface (up to 1 nm depth) is identified by X-ray photo-electronic spectroscopy analysis. The analysis data confirmed that the compounds of TlS, Tl2S, Tl2SO4, Tl(OH)3, S8 and Tl2O3 were formed on the surface of the layers. The morphology of thallium sulphide layers and the mechanism of their formation are determined by means of scanning atomic force and electronic microscopy. Two processes take place during the formation of the layer: desorption of sulphur and reaction of thallium ions from the thallium(I) salt solution with sulphur present on the LDPE surface. The layer of thallium sulphides is formed on the surface of the sulphur layer. Deposition of thallium sulpfide films from the solution of higher polythionic acid on the LDPE films is not homogeneous, it has the separated island type morphology. The identified regularities let purposively choose the conditions for sulphurisation of LDPE films by using the solution of higher polythionic acid as the agent of polymer sulphurisation in order to compose the layers of thallium sulphides, TlxSy, of the desired chemical and phasic composition on the surface of this polymer by means of the sorption–diffusion method.

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Chemical deposition of copper sulfide films in the surface of polyamide by the use of higher polythionic acids

Cited by 16 publications

References 1 publication

Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film

Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film

Comparison of the efficacy of sulfurization agents in decreasing the sheet resistance of polyamide and polyethylene with copper sulfide layers and influence of their compositions

Higher polythionic acids – the precursors for formation of thallium sulphide layers on polyethylene surface

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