Chemical Characterisation of the USGS Reference Glasses GSA-1G, GSC-1G, GSD-1G, GSE-1G, BCR-2G, BHVO-2G and BIR-1G Using EPMA, ID-TIMS, ID-ICP-MS and LA-ICP-MS

Abstract

The USGS reference glasses GSA‐1G, GSC‐1G, GSD‐1G, GSE‐1G, BCR‐2G, BHVO‐2G and BIR‐1G were investigated by different analytical techniques. All these materials have a geological (basaltic) matrix and are therefore useful in igneous geochemistry as matrix‐matched reference materials for microanalytical techniques. The new GS glasses have trace elements in groups at concentration levels of about < 0.01, 5, 50 and 500 μg g‐1. Their major element compositions have been determined by EPMA, and trace elements have been analysed by LA‐ICP‐MS and two isotope dilution techniques using TIMS and ICP‐MS. EPMA and LA‐ICP‐MS analyses indicated that the USGS reference glasses are homogeneous at the μm to mm scale with respect to major (variations < 1‐2%) and most trace elements (variations 1‐4%). Trace element data obtained from the different analytical techniques agreed within an uncertainty of 1‐5%, indicating that between method results are comparable. Therefore, the preliminary working values for the four USGS GS glasses calculated from these data have a low level of uncertainty.

Methodology for the Determination of Trace and Minor Elements in Minerals and Fused Rock Glasses with Laser Ablation Associated with Quadrupole Inductively Coupled Plasma Mass Spectrometry (LA-Q-ICPMS)

“…These RM's were used as quality control standards with 30 to 60 obtained values for each analyzed element. Reference values for LA-ICPMS are quoted in [11] and in [10]. In the GEOREM site [14] preferred values are also listed with a mention of the used analytical technique.…”

“…The implementation of this methodology at our laboratory started with the handling and analytical determinations using NIST materials for calibration, followed by analytical determinations of the USGS synthetic basaltic glasses (BHVO-2G, BIR-1G and BCR-2G) [8], and, additionally, of the substances offered by the Max Planck Institute [10]. The results obtained for these reference materials during the last 4 years of analytical determinations in our laboratory (where these materials were also analyzed as unknown substances) are here presented and discussed.…”

Boron Enrichment in Martian Clay

“…Data were corrected for sensitivities among B, Ca, and Mg using USGS basaltic glass standards BCR-2G and GSA-1G, containing 6±1 ppm and 23±7 ppm boron, respectively (from GeoRem data base, [40]). BCR-2G was prepared by melting kilogram aliquots of (powdered) BCR-2 (Columbia River basalt), BHVO-2 (Hawaiian Volcanic Observatory basalt), and BIR-1 (Icelandic basalt), at 1540°C under a nitrogen atmosphere.…”

Trace Element Analysis of Minerals in Magmatic-Hydrothermal Ores by Laser Ablation Inductively-Coupled Plasma Mass Spectrometry: Approaches and Opportunities

“…This includes: (i) poly-atomic interferences such as the generation of argides if using Ar as the plasma gas (e.g., argides of Cu and Ni (e.g., [45])) that may interfere with Pd, Rh, and Ru ( 101 Ru with 61 Ni 40 Ar, and so on); (ii) isobaric interferences between elements which have the same isotopic masses (e.g., 108 Pd with 108 Cd, 115 In with 115 Sn); and (iii) multiple ionization interferences (generally less significant for trace element analysis). An understanding of potential interferences and isotopic proportions is necessary to know whether or not corrections need to be applied (for instance, correction of 101 Ru for 61 Ni 40 Ar when analyzing pentlandite, or 115 In for 115 Sn in stannite, Ni and Sn being major components of the two sulphides). Other potential interferences may not necessitate correction.…”

“…Other potential interferences may not necessitate correction. For example, 92 Zr measurement in magnetite need not be corrected for 52 Cr 40 Ar since Cr is a minor component of magnetite and interference is thus negligible. The same would apply to analysis of In and Sn in sphalerite, since both elements are only minor components of that mineral, and any interference would be small, within the precision of the method.…”