2016
DOI: 10.1016/j.jtemb.2016.04.014
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Chemical bioimaging for the subcellular localization of trace elements by high contrast TEM, TEM/X-EDS, and NanoSIMS

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Cited by 36 publications
(32 citation statements)
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“…Samples were cut in 70 and 300 nm sections for TEM and NanoSIMS, respectively, using a diamond knife (Diatome, Biel‐Bienne, Switzerland) on an ultra‐microtome (EM Ultracut‐UC7, Leica Microsystems) and placed on the respective sample holder. In order to carry out the correlative imaging by TEM and NanoSIMS, a first 70 nm section was placed on a copper grid for TEM and then, an adjacent 300 nm section was placed on a silicon wafer (Wafer Solution, Le Bourget du lac, France) for NanoSIMS, as previously described (Penen et al, ). Cells were localized and observed first by TEM and then, relocalized and analysed by NanoSIMS.…”
Section: Methodsmentioning
confidence: 99%
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“…Samples were cut in 70 and 300 nm sections for TEM and NanoSIMS, respectively, using a diamond knife (Diatome, Biel‐Bienne, Switzerland) on an ultra‐microtome (EM Ultracut‐UC7, Leica Microsystems) and placed on the respective sample holder. In order to carry out the correlative imaging by TEM and NanoSIMS, a first 70 nm section was placed on a copper grid for TEM and then, an adjacent 300 nm section was placed on a silicon wafer (Wafer Solution, Le Bourget du lac, France) for NanoSIMS, as previously described (Penen et al, ). Cells were localized and observed first by TEM and then, relocalized and analysed by NanoSIMS.…”
Section: Methodsmentioning
confidence: 99%
“…Ion beam and X‐ray beam imaging techniques are powerful tools to study the isotopic and elemental composition of single cells (Ortega, Devès, & Carmona, ; Penen et al, ; Roschzttardtz et al, ; Sarret et al, ; Schaumlöffel et al, ). Nanoscale secondary ion mass spectrometry (NanoSIMS) allows elemental and isotopic mapping with a resolution of about 50 nm.…”
Section: Introductionmentioning
confidence: 99%
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“…One application of the new source was the imaging of trace elements in single cells (Penen et al . ), by combining transmission electron microscopy (TEM) and NanoSIMS. A similar methodology was also developed by Miot et al .…”
Section: Advances In Secondary Ion Mass Spectrometrymentioning
confidence: 99%
“…The technique is capable of analyzing the sub-micron-scale distribution of Cu, as it has been applied with different environmental samples including, for instance, atmospheric particles, Au-bearing pyrite, biological samples, and aggregates from an arable soil horizon. [12][13][14][15][16][17][18][19] To the best of our knowledge, the small-scale Cu distribution in contaminated technogenic soil has not been studied by NanoSIMS and subsequently evaluated by digital image processing yet. We therefore hypothesized that the combination of NanoSIMS analyses and image processing would help to enlighten the previously unknown sub-micron Cu distribution.…”
Section: Introductionmentioning
confidence: 99%