“…The percent relative standard deviation values displayed in the 3rd and 6th columns of Table 5 represent a measure of the precision of the method, as regards sample preparation and instrumentation errors, including counting errors. Table 6 compares the matrix-corrected XRF data obtained from the international reference standards, utilizing a multiple linear regression program (MLRP), with the recommended chemical values (Flanagan, 1969(Flanagan, , 1973Abbey, 1972Abbey, , 1973Abbey, , 1977Ingamells and Suhr, 1963;Goldich and others, 1967;Ingamells and others, 1971; de la Roche and Govindaraju, 1971Govindaraju, , 1973Loney and others, 1971;Crock, 1975;Huffman, pre-1976;Myers and others, 1976) for the major element oxides of the calibration standards. The upper limits of the working concentration ranges for certain of the elements have since been extended upward as follows: Si02: 90%; Ti02: 3.5%; MnO: 1.5%; and ?2®5 : 2 -°^-Accuracy for these primary standards was measured as the average absolute relative error or difference between the matrix-corrected XRF intensity values of the various elements analysed for, translated into concentrations, and "best value" literature concentration values.…”