2016
DOI: 10.1016/j.atmosenv.2016.08.053
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Chemical and morphological characterization of TSP and PM2.5 by SEM-EDS, XPS and XRD collected in the metropolitan area of Monterrey, Mexico

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Cited by 47 publications
(26 citation statements)
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“…In the MMA, several studies have been conducted to chemically characterize the ambient PM 2.5 and PM 10 (Badillo-Casta ñeda et al. 2015;Blanco-Jiménez et al 2015;Garza-Oca ñas et al 2010;González et al 2016;González Cárdenas 2014;Mancilla et al 2016;Martínez et al 2012), and other studies have used these chemical characterizations to carry out source apportionment calculations (Mancilla et al 2016;Martínez et al 2012) and develop chemical emission profiles for PM 2.5 (Mancilla, Araizaga, and Mendoza 2012;Medina Gaitán 2015;Valdez Cerda et al 2011). However, many of these studies have focused on PM 2.5 ; only Blanco-Jim énez et al (2015) estimated a preliminary source contribution for PM c .…”
Section: Introductionmentioning
confidence: 99%
“…In the MMA, several studies have been conducted to chemically characterize the ambient PM 2.5 and PM 10 (Badillo-Casta ñeda et al. 2015;Blanco-Jiménez et al 2015;Garza-Oca ñas et al 2010;González et al 2016;González Cárdenas 2014;Mancilla et al 2016;Martínez et al 2012), and other studies have used these chemical characterizations to carry out source apportionment calculations (Mancilla et al 2016;Martínez et al 2012) and develop chemical emission profiles for PM 2.5 (Mancilla, Araizaga, and Mendoza 2012;Medina Gaitán 2015;Valdez Cerda et al 2011). However, many of these studies have focused on PM 2.5 ; only Blanco-Jim énez et al (2015) estimated a preliminary source contribution for PM c .…”
Section: Introductionmentioning
confidence: 99%
“…The calciumrich particles usually showed more roundness than other particles [23]. There were also Si-rich particles (95.47 nm and 139.8 nm), which were characterized by a prismatic, regular morphology typically observed in crystalline materials [16]. Figure 4c, d shows the mass fractions of heavy metals.…”
Section: Apparent Composition Analysis Of Ultrafine Particlesmentioning
confidence: 96%
“…SEM offers the possibility to relate visually the morphology and size. XPS provides qualitative and semiquantitative information regarding the chemical composition, oxidation state and bonding energy of the elements composing the particles [16].…”
Section: Introductionmentioning
confidence: 99%
“…There are many ways to characterize the organic and inorganic compounds, such as X-ray photoelectron spectroscopy (XPS), scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDS), X-ray powder diffraction (XRD), and time-of-flight secondary ion mass spectrometry (TOF-SIMS), [33][34][35][36][37][38] in which TOF-SIMS is one of the important research tools, [39][40][41][42][43] because more convincing results can be obtained than other analytical techniques in the identification of compounds. Currently, TOF-SIMS has been applied to many fields including surface characteristics of aerosol particles, the depth distribution characteristics of chemical composition, surface chemical reactions, chemical toxicity, and emission characteristics of pollution sources.…”
Section: Articlementioning
confidence: 99%