Chemical and microstructural study in radio frequency sputtered CdTe oxide films prepared at different N2O pressures. Oxygen incorporation and film resputtering

The comprehensive evaluation of the structural and functional properties of the gas- statically treated Au–CdZnTe–Au structures for X- and gamma-ray detectors

“…In the high frequency range (500-800 cm À 1 ) of the Raman spectrum of the initial (non-treated) sample, the complex multicomponent vibrational modes are observed. The mentioned modes are induced by the different crystalline configurations of tellurium oxide (Caballero-Briones et al, 2003, 2008. In particular, the wide band near 500-700 cm À 1 is associated with the [TeO 4 ] À 4 trigonal bipyramids (tbp) and the band at 700-800 cm À 1 is related to the [TeO 3 ] À 2 trigonal pyramids (Caballero-Briones et al, 2003).…”

Ab initiomolecular dynamics study of amorphousCdTeOxalloys: Structural properties

“…[3][4][5][6][7][8] Oxidized CdTe thin films, obtained by rf sputtering, have been extensively studied in the last 15 years. [9][10][11][12][13][14][15][16][17][18][19][20][21][22][23] These films present a depth profile with nearly homogeneous composition, and have potential applications as coating layers and optical windows with tunable band gap in CdTe-based devices. The composing material, a-CdTeO x , has amorphous structure and is a transparent insulator with an optical gap that can be tuned between 1.5 and 3.4 eV, depending on the oxygen content ͑0 Ͻ x Ͻ 3͒.…”

“…Most of the experimental work on the amorphous oxidized CdTe thin films up to now has been devoted to the optimization of growth techniques, 9,10,12,13,20 phase identification, element quantification, 11,14 and description of the optical 9,15,[17][18][19] and vibrational properties. 21,22 Employed techniques include optical, Raman, x-ray photoemission, and Auger electron spectroscopy. For a few crystalline phases, diffraction studies 27,28 have been published, but nothing is known about the structure of the amorphous phases.…”