Synchrotron Radiation 2014
DOI: 10.1007/978-3-642-55315-8_21
|View full text |Cite
|
Sign up to set email alerts
|

Chemical and Magnetic Imaging with X-Ray Photoemission Electron Microscopy

Abstract: X-ray photoemission electron microscopy (XPEEM) is a full-field imaging technique giving access to the chemical state and magnetic order of laterally inhomogeneous surfaces, interfaces and thin films. In its simplest variant, synchrotronbased PEEM uses secondary emission to map local differences in the oxidation state, valence, and bond orientation around the emitter. The combination with X-ray circular and linear dichroism techniques represents the most frequent application, and has found extensive use in ima… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
7
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
4

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(7 citation statements)
references
References 92 publications
0
7
0
Order By: Relevance
“…Our substrate, Ir(100), offers the advantage of tunable film–substrate interaction, favoring diffusion of intercalated atoms at temperatures higher than 500 °C, when the film completely decouples from the substrate; , similar to Ru(0001) and Ir(111), , it also warrants that the intercalated atoms are sealed under graphene, due to substrate chemisorption of the graphene’s island edges. Combined use of low energy electron microscopy (LEEM) and synchrotron-based photoemission electron microscopy (XPEEM) gave us access to the interface structure and composition. Thanks to high sensitivity to near-surface species, XPEEM allowed mapping the lateral distribution of intercalated Ar and its evolution upon annealing.…”
mentioning
confidence: 99%
“…Our substrate, Ir(100), offers the advantage of tunable film–substrate interaction, favoring diffusion of intercalated atoms at temperatures higher than 500 °C, when the film completely decouples from the substrate; , similar to Ru(0001) and Ir(111), , it also warrants that the intercalated atoms are sealed under graphene, due to substrate chemisorption of the graphene’s island edges. Combined use of low energy electron microscopy (LEEM) and synchrotron-based photoemission electron microscopy (XPEEM) gave us access to the interface structure and composition. Thanks to high sensitivity to near-surface species, XPEEM allowed mapping the lateral distribution of intercalated Ar and its evolution upon annealing.…”
mentioning
confidence: 99%
“…Similarly the second bracket of Eq. (10), which depends on ðΘ 0 Δf Þ 2 , can be neglected when Eq. ( 11) is satisfied.…”
Section: Resultsmentioning
confidence: 99%
“…We detail an alternative method to remove the contrast due to in-plane magnetization and the electrostatic potential in Eq. (10), for example when it is not possible to satisfy Eq. (11).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…1(a) and 1(b)), the Ru(0001) -NSA surfaces contain randomly distributed nanosized protrusions with height of 2 to 6 Å which are ascribed to the formation of near-surface Ar nanobubbles (Figs. 1(c) and 1(d)) [32]. Local XAS characterization from synchrotron-based XPEEM can provide direct evidence on the protrusions' composition, with a spatial resolution of 20 nm [33].…”
Section: Transition From Anisotropic To Isotropic Growth Of Graphene On Ru(0001) By Dosing Near-surface Ar Nanobubblesmentioning
confidence: 99%