Charging regime of pur spinel studied by secondary electron emission

Boughariou, A.; Kallel, A.; Blaise, G.

doi:10.1016/j.physb.2013.01.011

Cited by 5 publications

(4 citation statements)

References 13 publications

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“…If the material is charged positively and as the primary electrons injection is pursued, the number of holes presents in the material, of individual cross section σ hole (the recombination cross section of electron–hole) will increase and affect the SEE yield σ along the charging process (Boughariou et al ., ). In this case, conservation equations for free secondary electrons whose flux is j ( z , t ) (in number per surface unit and per second) and for trapped sites ρ trapped ( z , t ) (in number per volume unit), will conduct to the following two equations for charge conservation:

\begin{matrix} true \\ right d (j_{EES} - j_{prim}) / d z & = & left S_{electron - hole} - (() \sum_{abs 0} + ρ_{trapped} σ_{hole}) j_{EES} \\ = & left d ρ_{trapped} / d t, \end{matrix}

where j prim ( z ) is the primary electron flux, in number per surface unit and per unit of time; S electron–hole ( z ) = j prim ( z )/λ source is the source term of electron–hole pairs, which depends on z and on E 0 (Glavatskikh et al ., ), Σ abs = Σ abs0 + ρ trapped σ hole is the total cross section of trapping of free electrons by volume unit (initial traps + holes created subsequently); its unity is length −1; and σ hole is the elementary recombination cross section between secondary electron and hole (in cm 2 per hole).…”

Section: Modelling Of See Time Evolutionmentioning

confidence: 99%

“…If the material is charged positively and as the primary electrons injection is pursued, the number of holes presents in the material, of individual cross section σ hole (the recombination cross section of electron-hole) will increase and affect the SEE yield σ along the charging process (Boughariou et al, 2013). In this case, conservation equations for free secondary electrons whose flux is j(z, t) (in number per surface unit and per second) and for trapped sites ρ trapped (z, t) (in number per volume unit), will conduct to the following two equations for charge conservation:…”

Section: Positive Chargingmentioning

confidence: 99%

“…If the material is charged negatively, the increase of the SEE yield is expected (Boughariou et al, 2013) because the secondary electrons undergo elimination in traps, so there will be a saturation of initial defects of individual cross-section σ T (the elementary cross section for electron trapping), whose density decreases when charging proceeds. The conservation equation for free secondary electrons is written as follows:…”

Section: Negative Chargingmentioning

confidence: 99%

“…There is a growing interest for the electrical properties of pure spinel (Boughariou et al 2009;Boughariou et al, 2013). It is characterized by high irradiation resistance, a high melting temperature (Boch et al, 2001), good thermal conductivity and an ability to confine the radioactive elements such as Cs, Thomé et al, 2006).…”

Section: Introductionmentioning

confidence: 99%

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Evaluation of the effective cross‐sections for recombination and trapping in the case of pure spinel

Boughariou

Damamme

Kallel

2014

Journal of Microscopy

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In this paper, we have investigated the evolution of the secondary electron emission in the case of pure spinel during electron irradiation, achieved in a scanning electron microscope at room temperature, which is derived from the measurement of the induced and the secondary electron currents. It was observed from the experimental results, that there are two regimes during the charging process: a plateau followed by a linear variation, which are better identified by plotting the logarithm of the secondary electron emission yield lnσ as function of the total surface density of trapped charges in the material QT . For positive charging, E0 = 1.1 and 5 keV, the slope of the linear part, whose value is of about 10(-10) cm(2) charge(-1), is independent of the primary electron energy. It is interpreted as a microscopic cross section for electron-hole recombination. For negative charging of pure spinel, E0 = 15 and 30 keV, the slope is associated with an electron trapping cross section close to 10(-14) cm(2) charge(-1), which can be assigned to the microscopic cross section for electron trapping. This trapping cross section is four orders of magnitude lower than the recombination one.

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\begin{matrix} true \\ right d (j_{EES} - j_{prim}) / d z & = & left S_{electron - hole} - (() \sum_{abs 0} + ρ_{trapped} σ_{hole}) j_{EES} \\ = & left d ρ_{trapped} / d t, \end{matrix}

Section: Modelling Of See Time Evolutionmentioning

confidence: 99%

“…If the material is charged positively and as the primary electrons injection is pursued, the number of holes presents in the material, of individual cross section σ hole (the recombination cross section of electron-hole) will increase and affect the SEE yield σ along the charging process (Boughariou et al, 2013). In this case, conservation equations for free secondary electrons whose flux is j(z, t) (in number per surface unit and per second) and for trapped sites ρ trapped (z, t) (in number per volume unit), will conduct to the following two equations for charge conservation:…”

Section: Positive Chargingmentioning

confidence: 99%

Section: Negative Chargingmentioning

confidence: 99%