2011
DOI: 10.1002/smll.201101467
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Charge Trapping by Self‐Assembled Monolayers as the Origin of the Threshold Voltage Shift in Organic Field‐Effect Transistors

Abstract: The threshold voltage is an important property of organic field-effect transistors. By applying a self-assembled monolayer (SAM) on the gate dielectric, the value can be tuned. After electrical characterization, the semiconductor is delaminated. The surface potentials of the revealed SAM perfectly agree with the threshold voltages, which demonstrate that the shift is not due to the dipolar contribution, but due to charge trapping by the SAM.

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Cited by 65 publications
(78 citation statements)
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References 25 publications
(31 reference statements)
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“…This result has been further utilized in the development of OFETs resilient against bias stress by using gate dielectrics with high ionization potentials, such as the fluoropolymer Cytop . Alternatively, the incorporation of a nanometer‐thick interlayer between the OSC and the gate dielectric can either facilitate charge transfer or provide a nanoscale physical barrier that reduces charge tunneling …”
Section: The Effects Of Bias Stress On Organic Transistorsmentioning
confidence: 99%
“…This result has been further utilized in the development of OFETs resilient against bias stress by using gate dielectrics with high ionization potentials, such as the fluoropolymer Cytop . Alternatively, the incorporation of a nanometer‐thick interlayer between the OSC and the gate dielectric can either facilitate charge transfer or provide a nanoscale physical barrier that reduces charge tunneling …”
Section: The Effects Of Bias Stress On Organic Transistorsmentioning
confidence: 99%
“…Though this model provides a nice qualitative explanation for the data, the dipole contribution is not sufficient to explain a threshold voltage shifts up to 60 V. In fact, in order to explain such a large threshold voltage shift invoking a dipole layer, the molecular dipole moments must exceed the unrealistic value of 50 debyes. Therefore, as an alternative model to explain V T shifts of the order of tens of volts, SAM‐related space charge layers have been recently proposed by Gholamrezaie et al The surface potential of the gate dielectric modified by an SAM was measured by means of scanning Kelvin probe microscopy (SKPM), proving that the CH 3 ‐SAM is inactive as expected for a nonpolar molecules such a –CH 3 is. The NH 2 –SAM traps positive charges, while F–SAM traps negative charges, in line with the NH 2 molecule being less electronegative than F ones.…”
Section: Dielectrics Surface Modification Strategies For Organic–biolmentioning
confidence: 99%
“…4 These are ob-2 viously desired qualities in particular for manufacturing gate dielectrics in organic field-effect transistors (OFET), for which the deposition of an organic semiconductor directly onto the untreated standard SiO 2 substrate leads to ill reproducible results in terms of threshold/onset voltage and charge carrier mobilities due to the presence of defects. 5,6 The effect of SAM functionalization on OFET performances is often remarkable since it leads to controllable shifts of the threshold voltage (which depends on the chemical nature of the SAM itself), it allows to modulate the charge carrier mobility of the overlying organic semiconductor, [7][8][9][10][11][12][13][14][15] and even to control the band gap opening in highly conductive materials such as graphene. 16 The microscopic origin of the modulating effect of SAM on OFET performances is a matter of intense theoretical studies.…”
Section: Introductionmentioning
confidence: 99%