Charge-Trapping Non-Volatile Memories 2017
DOI: 10.1007/978-3-319-48705-2_2
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Charge-Trap-Non-volatile Memory and Focus on Flexible Flash Memory Devices

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Cited by 5 publications
(2 citation statements)
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“…Since then, many works have attributed the bistable switching device behaviors to this model. 32,[69][70][71][72][73][74][75][76][77][78] It is necessary, therefore, to examine the details of this model if the features are to be identified and the differences to be recognized. Under this proposed model, the 'write' operation is performed when a write voltage is applied to the device, during which the charges (electrons in this case) tunnel through the insulator barrier and start populating the nanoparticles.…”
Section: Charge Trapping and Internal Field Modelmentioning
confidence: 99%
See 1 more Smart Citation
“…Since then, many works have attributed the bistable switching device behaviors to this model. 32,[69][70][71][72][73][74][75][76][77][78] It is necessary, therefore, to examine the details of this model if the features are to be identified and the differences to be recognized. Under this proposed model, the 'write' operation is performed when a write voltage is applied to the device, during which the charges (electrons in this case) tunnel through the insulator barrier and start populating the nanoparticles.…”
Section: Charge Trapping and Internal Field Modelmentioning
confidence: 99%
“…Further information on this model will be presented along with the device measurements. Various devices have been studied under this model to successfully explain device bistability, including metal nanoparticles, 5,32,70,79–81 macromolecules, 69,76–78,82 ferroelectric nanocomposites, 75,83 nanowires, 71–73 and other organic molecules. 74…”
Section: Introductionmentioning
confidence: 99%