“…However, CMOS scaling has reached its physical limit, and new technology needs to be developed to keep up the performance with great scalability, high speed, and low power consumption. Among the family of memory devices, nonvolatile memory (NVM) plays an important role and Resistive Random Access Memory , (RRAM) has received significant attention due to its simple architecture, smaller size, long write/read endurance ,, (>10 16 cycles), faster operating speed, excellent scalability (<10 nm), higher storage density, low cost, low power consumption, excellent compatibility etc. Most popular RRAM devices are transition metal oxide based − , but issues like presence of defects, interstitial impurities, grain boundary and polar discontinuity etc.…”