2011
DOI: 10.1016/j.orgel.2010.11.014
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Charge transfer reactions in near IR absorbing small molecule solution processed organic bulk-heterojunction solar

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Cited by 34 publications
(26 citation statements)
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“…The FT-IR spectrum of compound 3 is shown in Figure 1 The NMR spectrum used to elucidate the structure of organic compounds gives important information. The 1 H NMR spectrum of the 4-(benzhydryloxy) phthalonitrile compound having an organic structure in DMSO-d 6 The mass spectra of the compounds of phthalocyanine confirm the structures of the compounds. The 1306.79 ion peak value obtained for zinc phthalocyanine is equivalent to the calculated mass of 1306.77.…”
Section: Synthesis and Characterizationmentioning
confidence: 82%
“…The FT-IR spectrum of compound 3 is shown in Figure 1 The NMR spectrum used to elucidate the structure of organic compounds gives important information. The 1 H NMR spectrum of the 4-(benzhydryloxy) phthalonitrile compound having an organic structure in DMSO-d 6 The mass spectra of the compounds of phthalocyanine confirm the structures of the compounds. The 1306.79 ion peak value obtained for zinc phthalocyanine is equivalent to the calculated mass of 1306.77.…”
Section: Synthesis and Characterizationmentioning
confidence: 82%
“…Finally, the carrier losses were evaluated by measuring the interfacial carrier recombination kinetics as reported previously. [33,34,[41][42][43][44][45][46][47][48] The charge extraction of 1a-b is depicted in Figure 6a and was determined by subtracting the contribution of the geometrical capacitance. The total extracted charges are shown in the Supporting Information ( Figure S20), where the geometric contribution is indicated by a straight line and the calculated values are 80 and 64 nF cm -2 for 1a and 1b, respectively.…”
Section: Theoretical Calculationsmentioning
confidence: 99%
“…The application of X-ray diffraction (XRD) analysis is necessary to fully characterize the crystallite phase and orientation information, which is crucial in device fabrication [10]. To accomplish this goal, grazing incidence X-ray diffraction (GIXRD) has been used, since it offers more direct information than, e.g., selected area electron diffraction performed by transmission electron microscopy [11], where the crystal structure and orientation cannot be obtained without the substrate removal. In addition, a two-dimensional (2-D) area detector has been employed here, to obtain more complete crystal information than the diffraction intensity versus 2θ plot [12] where crystallite orientation cannot be obtained as efficiently.…”
Section: Open Accessmentioning
confidence: 99%