2017
DOI: 10.1038/s41598-017-06245-5
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Charge Injection, Carriers Recombination and HOMO Energy Level Relationship in Perovskite Solar Cells

Abstract: We present a comparative study between a series of well-known semiconductor polymers, used in efficient organic solar cells as hole transport materials (HTM), and the state-of-the art material used as hole transport material in perovskite solar cells: the spiro-OMeTAD. The observed differences in solar cell efficiencies are studied in depth using advanced photoinduced spectroscopic techniques under working illumination conditions. We have observed that there is no correlation between the highest occupied molec… Show more

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Cited by 98 publications
(76 citation statements)
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“…The corresponding WF and VBM of control perovskite is 4.22 and 1.55 eV, leading to an IE of 5.77 eV. The HOMO of spiro‐OMeTAD is around 5.2 eV . Thus, the energy barrier between the perovskite and spiro‐OMeTAD is reduced from 0.57 to 0.17 eV after multiple ligand passivation.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The corresponding WF and VBM of control perovskite is 4.22 and 1.55 eV, leading to an IE of 5.77 eV. The HOMO of spiro‐OMeTAD is around 5.2 eV . Thus, the energy barrier between the perovskite and spiro‐OMeTAD is reduced from 0.57 to 0.17 eV after multiple ligand passivation.…”
Section: Resultsmentioning
confidence: 99%
“…The HOMO of spiro-OMeTAD is around 5.2 eV. [14] Thus, the energy barrier between the perovskite and spiro-OMeTAD is reduced from 0.57 to 0.17 eV after multiple ligand passivation. To check whether the reduced energy barrier between IE of perovskite and HOMO of spiro-OMeTAD helps improve the hole extraction efficiency, the lifetime of perovskite coated with spiro-OMeTAD in the presence/absence of ligand is measured.…”
Section: Introductionmentioning
confidence: 99%
“…[83] Compared with the charge extraction process, charge transfer and recombination at the interface have a much stronger impact on the device performance like V oc and J sc . [87][88][89] Interfacial structural and electronic mismatches usually act as the energy barriers for charge transport and charge recombination. Interface engineering is needed to eliminate this effect.…”
Section: Charge Dynamicsmentioning
confidence: 99%
“…This point is confirmed by TRPL measurements (Figure c). The pattern obtained with TRPL has been fitted using a biexponential decay, as it has been previously reported in the literature . The value of the obtained characteristic times is depicted in Table S3.…”
Section: Figurementioning
confidence: 99%
“…Two characteristic times τ 1 and τ 2 have been obtained from the fitting. The fastest one, τ 1 , is associated with the charge carrier injection into HTM, whereas the slowest one, τ 2 , is associated with recombination . Deposition of FU7 layer on top of perovskite reduces τ 1 significantly indicating an efficient hole transfer.…”
Section: Figurementioning
confidence: 99%