2016
DOI: 10.1063/1.4943031
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Charge carrier localization effects on the quantum efficiency and operating temperature range of InAsxP1−x/InP quantum well detectors

Abstract: The effect of charge carrier localization resulting in “S-shaped” temperature dependence of the photoluminescence peak energy of InAsxP1−x/InP quantum wells (QWs) is distinctly revealed by the temperature dependent surface photo voltage (SPV) and photoconductivity (PC) processes. It is observed that the escape efficiency of carriers from QWs depends on the localization energy, where the carriers are unable to contribute in SPV/PC signal below a critical temperature. Below the critical temperature, carriers are… Show more

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Cited by 12 publications
(3 citation statements)
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“…Moreover, the technique is destructive since the sample is no more useful after measurement. In view of this, contactless measurement techniques like photoluminescence (PL), surface photo voltage (SPV) spectroscopy are attractive to probe the surface and interface defects 12 14 . It has been qualitatively understood that the linewidth of PL signal is determined by the extent of inhomogeneities and defects of the QW 15 19 .…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, the technique is destructive since the sample is no more useful after measurement. In view of this, contactless measurement techniques like photoluminescence (PL), surface photo voltage (SPV) spectroscopy are attractive to probe the surface and interface defects 12 14 . It has been qualitatively understood that the linewidth of PL signal is determined by the extent of inhomogeneities and defects of the QW 15 19 .…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, it supports the fact that the localized charge carriers generate the interface electric field opposite to the builtin electric field such that the FKOs are getting suppressed at low temperature regimes. The magnitude of the interface electric field directly depends upon the density of localization states associated at the interfaces, which governs the critical temperature range of FKOs [50]. Further, the integrated PL intensity variation suggests that the localizations are present in all three samples, which subsequently reduced down the PL intensity of ground state QW transition (P 1 peak) below the critical temperature.…”
Section: Resultsmentioning
confidence: 93%
“…SPV spectroscopy has been widely used in the characterization of bulk materials and various nanostructures. However, there are relatively few reports in the literature on SPV investigation of SiNWs. SPV spectroscopy was used to study the bandgap of vapor–liquid–solid (VLS)-grown undoped SiNWs and SiNWs doped with P and B, and to conclude on the NW crystal structurewurtzite or diamond .…”
Section: Introductionmentioning
confidence: 99%