2020 China Semiconductor Technology International Conference (CSTIC) 2020
DOI: 10.1109/cstic49141.2020.9282590
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Characterterization of Multi-Scale Nanosilver Paste Reinforced with SIC Particles

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“…The power density is increasing with the development of packaging integration of electronic devices, which will lead to more heat accumulation in electronic products [1]. Traditional interconnection materials cannot meet the requirements of high operating temperature for high power density devices [2].…”
Section: Introductionmentioning
confidence: 99%
“…The power density is increasing with the development of packaging integration of electronic devices, which will lead to more heat accumulation in electronic products [1]. Traditional interconnection materials cannot meet the requirements of high operating temperature for high power density devices [2].…”
Section: Introductionmentioning
confidence: 99%