2024
DOI: 10.3390/electronics13091664
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Characterizing Lossy Dielectric Materials in Shock Physics by Millimeter-Wave Interferometry Using One-Dimensional Convolutional Neural Networks and Nonlinear Optimization

Ngoc Tuan Pham,
Alexandre Lefrançois,
Hervé Aubert

Abstract: When a dielectric material undergoes mechanical impact, it generates a shock wave, causing changes in its refractive index. Recent demonstrations have proven that the modified refractive index can be determined remotely using a millimeter-wave interferometer. However, these demonstrations are based on the resolution of an inverse electromagnetic problem, which assumes that the losses in the material are negligible. This restrictive assumption is overcome in this article, in which a new approach is proposed to … Show more

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