2016
DOI: 10.1146/annurev-physchem-040214-121612
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Characterizing Localized Surface Plasmons Using Electron Energy-Loss Spectroscopy

Abstract: Electron energy-loss spectroscopy (EELS) offers a window to view nanoscale properties and processes. When performed in a scanning transmission electron microscope, EELS can simultaneously render images of nanoscale objects with sub-nanometer spatial resolution and correlate them with spectroscopic information of ∼ 10 − 100 meV spectral resolution. Consequently, EELS is a nearperfect tool for understanding the optical and electronic properties of individual and few-particle plasmonic metal nanoparticles assembl… Show more

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Cited by 66 publications
(79 citation statements)
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“…In STEM-EELS, the electron beam is used to both excite and measure, and then EELS reflects the magnitude of the induced electric field at the location of the sub-nanometer electron beam. It is also claimed that no qualitative difference is observed between STEM-EELS maps of LSPR modes and electric field enhancement for particles with edges and corners 28 . Further, most work in correlating STEM-EELS and LSPR has been done on nanoparticles or flat metal patterns.…”
Section: Introductionmentioning
confidence: 99%
“…In STEM-EELS, the electron beam is used to both excite and measure, and then EELS reflects the magnitude of the induced electric field at the location of the sub-nanometer electron beam. It is also claimed that no qualitative difference is observed between STEM-EELS maps of LSPR modes and electric field enhancement for particles with edges and corners 28 . Further, most work in correlating STEM-EELS and LSPR has been done on nanoparticles or flat metal patterns.…”
Section: Introductionmentioning
confidence: 99%
“…Experimentally, this typically involves transmission electron microscopy (TEM) and indirect approaches such as electron energy loss spectroscopy (EELS) 20, 21 or surface-enhanced Raman scattering (SERS) 22 . Based on experimentally determined geometries, electric fields can be calculated and compared with the EELS results, although caution must be taken when correlating the EELS mode maps with the plane-wave induced electric fields.…”
Section: Introductionmentioning
confidence: 99%
“…Here we monitor the energy loss of a monochromatic electron beam due to excitation processes in the sample. Taking advantage of the high spatial resolution of the electron beam, mapping of the local geometries of systems and their optical response through surface plasmon polaritons and localized surface plasmons [12][13][14], and band gap excitations can be performed [15][16][17][18][19].…”
Section: Introductionmentioning
confidence: 99%