2006
DOI: 10.1016/j.jcrysgro.2006.04.101
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Characterization of ZnO thin films deposited on diamond-like carbon coated onto Si and SiO2/Si substrate

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Cited by 16 publications
(4 citation statements)
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References 12 publications
(11 reference statements)
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“…This feature was also discussed by Yang et al [12] who presented temperature-dependent structure alteration of the ZnO layers It is obvious that, according to the peak angles shifting towards both (0 0 2) and (1 0 1) orientations, which are characteristics to ZnO pillar crystal structures, the temperature effect results in a more transparent crystalline structure.…”
Section: Samples (F) and (E)supporting
confidence: 55%
“…This feature was also discussed by Yang et al [12] who presented temperature-dependent structure alteration of the ZnO layers It is obvious that, according to the peak angles shifting towards both (0 0 2) and (1 0 1) orientations, which are characteristics to ZnO pillar crystal structures, the temperature effect results in a more transparent crystalline structure.…”
Section: Samples (F) and (E)supporting
confidence: 55%
“…These nucleation site is as much as the deposition rate therefore the grain size shrink to form a small particle. On the other case, the already deposited particles obtain more kinetic energy as the RF power increases and thus causes the grain to get bigger [18]. The XRD spectra of ZnO deposited with various RF power is shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The density of the crystallographic defects including dislocations, interstitials and vacancies in the ZnO thin films also decrease rapidly with the increase of annealing temperature [12,13]. In order to study the dependence of the mean grain size on the post annealing temperature, we calculated the size of the crystal based on Scherrer equation [14]. The calculated crystal size is in the range of 30.5-32.8 nm.…”
Section: Resultsmentioning
confidence: 99%