2009
DOI: 10.1364/aop.1.000308
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Characterization of ultrashort electromagnetic pulses

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Cited by 369 publications
(269 citation statements)
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“…This complex measurement can be achieved using high-speed photodiode which converts a fast optical signal into a fast electric current, fast oscilloscopes to observe the waveform, wide bandwidth spectrum analyzers and other elements. Short pulse characterization using time-frequency map such as frequency-resolved optical gating (FROG) (Trebino, 2000), spectral phase interferometry for direct-field reconstruction (SPIDER) (Dorrer et al, 1999) are well established tools for ultrafast metrology (Walmsley and Dorrer, 2009;Wollenhaupt et al, 2007). Extending these techniques to a single photon time and frequency resolved detection is challenging and may be achieved if combined with on-chip tunable detectors (Gustavsson et al, 2007) or upconversion processes (Gu et al, 2010;Ma et al, 2011).…”
Section: Spectral Diffusionmentioning
confidence: 99%
“…This complex measurement can be achieved using high-speed photodiode which converts a fast optical signal into a fast electric current, fast oscilloscopes to observe the waveform, wide bandwidth spectrum analyzers and other elements. Short pulse characterization using time-frequency map such as frequency-resolved optical gating (FROG) (Trebino, 2000), spectral phase interferometry for direct-field reconstruction (SPIDER) (Dorrer et al, 1999) are well established tools for ultrafast metrology (Walmsley and Dorrer, 2009;Wollenhaupt et al, 2007). Extending these techniques to a single photon time and frequency resolved detection is challenging and may be achieved if combined with on-chip tunable detectors (Gustavsson et al, 2007) or upconversion processes (Gu et al, 2010;Ma et al, 2011).…”
Section: Spectral Diffusionmentioning
confidence: 99%
“…The accurate measurement of the amplitude and phase profiles of ultrafast optical signals is critical for a wide range of applications [4], ranging from metrology to coherent optical telecommunications [1][2][3]. Interferometry is broadly used in optics to measure the phase and amplitude of the electric field [4,12].…”
mentioning
confidence: 99%
“…Considering that the charge carrier or exciton dynamics in nanomaterials evolves on a very short timescale, typically ranging from tens of femtoseconds to a few nanoseconds [8] , one needs to resort to ultrafast optical means [11][12][13][14] to 'visualize' the dynamic processes of interest. In this respect, time-resolved femtosecond pump-probe spectroscopy has become one of the most extensively adopted techniques since the advent of ultrafast laser systems that produce pulses with femtosecond duration in the early 1990s.…”
Section: Introductionmentioning
confidence: 99%