2018
DOI: 10.1002/aenm.201703468
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Characterization of the Valence and Conduction Band Levels of n = 1 2D Perovskites: A Combined Experimental and Theoretical Investigation

Abstract: This study presents a combined experimental and theoretical study of the electronic structure of two two-dimensional (2D) metal halide perovskite films. Ultraviolet and inverse

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Cited by 82 publications
(133 citation statements)
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References 51 publications
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“…With the increase of BABr:PbBr 2 ratio, the mixed BABr/PbBr 2 film gets closer to the 2D BA 2 PbBr 4 film. Especially, for the film made with BABr:PbBr 2 = 1:2, a diffraction peak at 6.4° is visible which is similar to the value reported for BA 2 PbBr 4 . After spin‐coating FABr solution and then thermal annealing, the PbBr 2 and mixed BABr/PbBr 2 films are converted to the FAPbBr 3 or mixed 2D/3D perovskite films (Figure d).…”
Section: Resultssupporting
confidence: 76%
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“…With the increase of BABr:PbBr 2 ratio, the mixed BABr/PbBr 2 film gets closer to the 2D BA 2 PbBr 4 film. Especially, for the film made with BABr:PbBr 2 = 1:2, a diffraction peak at 6.4° is visible which is similar to the value reported for BA 2 PbBr 4 . After spin‐coating FABr solution and then thermal annealing, the PbBr 2 and mixed BABr/PbBr 2 films are converted to the FAPbBr 3 or mixed 2D/3D perovskite films (Figure d).…”
Section: Resultssupporting
confidence: 76%
“…Especially, for the film made with BABr:PbBr 2 = 1:2, a diffraction peak at 6.4° is visible which is similar to the value reported for BA 2 PbBr 4 . [40] After spin-coating FABr solution and then thermal annealing, the PbBr 2 and mixed BABr/PbBr 2 films are converted to the FAPbBr 3 or mixed 2D/3D perovskite films ( Figure 1d). For all these films, the dominant diffraction peak is located around 14.7°, which can be attributed to 3D FAPbBr 3 .…”
Section: Resultsmentioning
confidence: 99%
“…Using the Tauc method, [20] the optical gap is determined to be 2.21 eV, smaller than the 2.38 eV found for the n = 1 analogous iodide RPP, BA 2 PbI 4 . [14] X-ray diffraction (XRD) shows the existence of (020) and (040) peaks characteristic of horizontal stacking as well as the (111) and (202) peaks characteristic of vertical stacking suggesting a mixed orientation of grains ( Figure 1b). The interlayer spacing is 1.978 nm, which is structurally consistent with the 1.383 nm spacing in the BA 2 PbI 4 given the additional Pb-I layer in each repeating unit.…”
Section: Processing and Characterizationmentioning
confidence: 99%
“…The interlayer spacing is 1.978 nm, which is structurally consistent with the 1.383 nm spacing in the BA 2 PbI 4 given the additional Pb-I layer in each repeating unit. [10,14]…”
Section: Processing and Characterizationmentioning
confidence: 99%
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