2022
DOI: 10.1038/s41565-022-01148-7
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Characterization of the structure and chemistry of the solid–electrolyte interface by cryo-EM leads to high-performance solid-state Li-metal batteries

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Cited by 87 publications
(70 citation statements)
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“…In contrast, the interfacial layer derived from commercial electrolyte consists of many organic components such as C–O, O–CO, and a small number of inorganic compounds, Li 2 O, owing to the interfacial reaction between carbonate solvents and Li metal (Figure S22). The SEI composed of these organic components with poor mechanical strength generally fails to impede the growth of Li dendrites . To further clearly reveal the distribution of the above components in the SEI, TOF-SIMS was performed here for both M-ILE and ILE systems.…”
Section: Resultsmentioning
confidence: 94%
See 1 more Smart Citation
“…In contrast, the interfacial layer derived from commercial electrolyte consists of many organic components such as C–O, O–CO, and a small number of inorganic compounds, Li 2 O, owing to the interfacial reaction between carbonate solvents and Li metal (Figure S22). The SEI composed of these organic components with poor mechanical strength generally fails to impede the growth of Li dendrites . To further clearly reveal the distribution of the above components in the SEI, TOF-SIMS was performed here for both M-ILE and ILE systems.…”
Section: Resultsmentioning
confidence: 94%
“…The SEI composed of these organic components with poor mechanical strength generally fails to impede the growth of Li dendrites. 43 To further clearly reveal the distribution of the above components in the SEI, TOF-SIMS was performed here for both M-ILE and ILE systems. As shown in Figures 4l and S23, the intensity signal of LiF 2 − is higher in the M-ILE-derived SEI than that in the ILE-derived SEI at different sputter times, indicating a LiF-rich SEI layer formed in the M-ILE system.…”
Section: Resultsmentioning
confidence: 99%
“…736,737 For example, the cryogenic electron microscopy has been applied for imaging of the SEI and Li plating morphologies to directly visualize the structure and reveal the function of the complex interphase at the atomic scale. 736,738 The interested reader may refer to some previous review articles for the detailed information. 23,494,694,739,740 In this section, we have mainly summarized some guidelines on the improvement of the interfacial issues for flexible and portable electrochemical energy devices.…”
Section: Chemicalmentioning
confidence: 99%
“…In addition to the existing material characterization tools, the advanced techniques especially in-situ methods are highly desired to probe and identify the buried interfaces; these ex-situ and in-situ characterization methods include the electron microscopy, X-ray computed tomography, transmission X-ray microscopy, nuclear magnetic resonance, time-of-flight secondary ion mass spectrometry, differential phase contrast scanning transmission electron microscopy, neutron depth profiling, X-ray absorption fine structure spectrum, and three-dimensional atom probe, etc. In particular, the cryogenic electron microscopy is becoming a vital tool with atomic resolution, which can maintain the native and fresh state of air-sensitive and beam-sensitive materials and/or interphases of the energy devices for high-resolution imaging. , For example, the cryogenic electron microscopy has been applied for imaging of the SEI and Li plating morphologies to directly visualize the structure and reveal the function of the complex interphase at the atomic scale. , The interested reader may refer to some previous review articles for the detailed information. ,,,, In this section, we have mainly summarized some guidelines on the improvement of the interfacial issues for flexible and portable electrochemical energy devices.…”
Section: Semi-solid/solid Electrolytes In Flexible and Portable Elect...mentioning
confidence: 99%
“…Given the XRD results, we were specifically hoping to capture the crystalline patterns that emerge in the ZNSE after cycling. Cryo-TEM is the most suitable technique for SEI characterization because it perfectly maintains the interfaces; unfortunately, cryo-TEM sample preparation is extremely difficult and relatively time-consuming, and detailed SEI structure is rarely reported in literature. , …”
mentioning
confidence: 99%