2009
DOI: 10.1016/j.jelechem.2009.03.018
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Characterization of the anodic growth and dissolution of antimony oxide films

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Cited by 18 publications
(16 citation statements)
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References 39 publications
(70 reference statements)
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“…Optical measurements were carried out at a wavelength of 546.1 nm using a Rudolph research rotating-analyzer automatic ellipsometer (vertical type, 2000 FT model). The experimental setup has been previously described [11]. The optical properties of an isotropic single layer are given by its complex refractive index, n = n À ki, where n stands for the refractive index and k for the extinction coefficient [22,23].…”
Section: Methodsmentioning
confidence: 99%
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“…Optical measurements were carried out at a wavelength of 546.1 nm using a Rudolph research rotating-analyzer automatic ellipsometer (vertical type, 2000 FT model). The experimental setup has been previously described [11]. The optical properties of an isotropic single layer are given by its complex refractive index, n = n À ki, where n stands for the refractive index and k for the extinction coefficient [22,23].…”
Section: Methodsmentioning
confidence: 99%
“…1a) has already been done [11] and is shown for the sake of comparison. According to literature, the anodic peaks at low potentials have been attributed to electroformation of different antimony species with soluble species formation up to finally yield the Sb 2 O 3 oxide [4,5], while the steady-state current obtained in the 0.9 V-3.5 V potential range has been attributed to the anodic growth of a Sb 2 O 3 film by an ionic conduction mechanism caused by a ''highfield" that drives the ionic migration as in typical ''valve" metals [11]. However, no clear explanation of the processes taking place at potentials higher than ca.…”
Section: Methodsmentioning
confidence: 99%
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