Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench

Obradors-Campos, D.; Ahedo, BegoÃ±a; Barcala, José Miguel; Calero, J.; Calvo, Pedro; Domínguez, Manuel; EstÃ©vez, Antonio; Figarola, J. M.; García-Tabarés, L.; Gavela, Daniel; Gómez, Pablo; Guirao, Antonio; Gutiérrez, Jose Luis; Iturbe, R.; Lagáres, J.I.; López, Daniel; LÃ3pez, Borja; Martinez, Luis; Munilla, Javier; Oliver, C.; Morales, Jose Pérez; Podadera, Ivan; GarcÃ­a, Enrique RodrÃ­guez; Toral, Fernando; Varela, Rodrigo; Vázquez, Cristina

doi:10.18429/jacow-ipac2017-tupik030

Proceedings of the 8th Int. Particle Accelerator Conf. 2017

DOI: 10.18429/jacow-ipac2017-tupik030

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Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench

D. Obradors-Campos¹,

BegoÃ±a Ahedo²,

José Miguel Barcala³

et al.

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Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench

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