2012
DOI: 10.1016/j.optlaseng.2011.10.006
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Characterization of the 3D resolution of topometric sensors based on fringe and speckle pattern projection by a 3D transfer function

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Cited by 11 publications
(16 citation statements)
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“…The DoF of our 3D sensor can be evaluated by determining its 3D MTF based on the blurring-induced roundness of a sharp edge. 30,31 For this purpose, we three-dimensionally captured a tilted edge (see Fig. 5(b)) and segmentally determined the 3D MTF over the DoF range via Fourier transform:…”
Section: Depth Of Field Characterizationmentioning
confidence: 99%
“…The DoF of our 3D sensor can be evaluated by determining its 3D MTF based on the blurring-induced roundness of a sharp edge. 30,31 For this purpose, we three-dimensionally captured a tilted edge (see Fig. 5(b)) and segmentally determined the 3D MTF over the DoF range via Fourier transform:…”
Section: Depth Of Field Characterizationmentioning
confidence: 99%
“…Practically, the alternating pattern is produced by a printout. To increase the accuracy of the ESF and to avoid difficulties according to undersampling, these contrast transitions are detected a certain amount of times and are summed up, obtaining an oversampled ESF [5]. This process has the effect whereby the ESF can be determined in one picture instead of the detection of several images by alternating spatial frequencies.…”
Section: Two-dimensional Modulation Transfer Functionmentioning
confidence: 99%
“…Further, a laser range scanner's accuracy is determined using the 3D-MTF procedure, while the influencing parameters, the use of the FFT parameters in the calculation process as well as the angle of the test target are investigated. Subsequently, the approaches of Goesele [4] were analysed and expanded by Berssenbrügge [5]. Hereby, the approaches were enlarged by using a speckle and a fringe pattern measurement system for the 3D-MTF determination process.…”
Section: Introductionmentioning
confidence: 99%
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“…Approaches employing the fringe projection technique for 3D shape retrieval [6,7] require an additional device for structured illumination. On the other hand, the acquisition of 3D data by automated correlation of a projected laser speckle pattern [8,9] can utilize the same laser that is used for DHI and DSP. Furthermore, it is possible to employ this technique also simultaneously with DHI and DSP.…”
Section: Introductionmentioning
confidence: 99%