Characterization of T-shaped terminal impedances of differential short stubs in advanced CMOS technology

Inui, C.; Fujishima, Minoru

doi:10.1109/icmts.2008.4509336

2008 IEEE International Conference on Microelectronic Test Structures 2008

DOI: 10.1109/icmts.2008.4509336

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Characterization of T-shaped terminal impedances of differential short stubs in advanced CMOS technology

C. Inui

Minoru Fujishima

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Characterization of T-shaped terminal impedances of differential short stubs in advanced CMOS technology

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References 3 publications

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