Characterization of Surface Viscoelasticity and Energy Dissipation in a Polymer Film by Atomic Force Microscopy

Wang, Dong; Liang, Xiao Bin; Liu, Yan Hui; Fujinami, So; Nishi, Toshio; Nakajima, Ken

doi:10.1021/ma201148f

Cited by 43 publications

(26 citation statements)

References 48 publications

(61 reference statements)

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“…In fact, the evolution of the atomic force microscope (AFM) is being shaped by the need to provide a full and non-invasive characterization of complex interfaces such as solid-liquid interfaces [1][2][3][4] , heterogeneous polymer interfaces [5][6][7] , energy-storage devices 8 , cells [9][10] or protein membranes [11][12][13][14] . Ideally, those methods should complement the high spatial resolution of AFM with the following properties: (1) material characterization independent of the probe properties; (2) quantitative; (3) minimal tip and sample preparation; and (4) compatible with high-speed data acquisition and imaging.…”

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confidence: 99%

Fast nanomechanical spectroscopy of soft matter

2014

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A method that combines high spatial resolution, quantitative and non-destructive mapping of surfaces and interfaces is a long standing goal in nanoscale microscopy. The method would facilitate the development of hybrid devices and materials made up of nanostructures of different properties. Here we develop a multifrequency force microscopy method that enables simultaneous mapping of nanomechanical spectra of soft matter surfaces with nanoscale spatial resolution. The properties include the Young's modulus and the viscous or damping coefficients. In addition, it provides the peak force and the indentation. The method does not limit the data acquisition speed nor the spatial resolution of the force microscope. It is noninvasive and minimizes the influence of the tip radius on the measurements. The same tip is used to measure in air heterogeneous interfaces with near four orders of magnitude variations in the elastic modulus, from 1 MPa to 3 GPa.

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Fast nanomechanical spectroscopy of soft matter

2014

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“…16,21 It has been difficult to relate phase shift and, here, energy dissipation E dis , to a specific material property. 27 The underlying physical mechanism, i.e., the phase shift origins, can be readily discriminated by measuring the normalized energy dissipation E * dis curve (E * dis ¼ E dis /E max dis with E max dis the maximum of the E dis vs. A/A 0 curve), that is, independent of experimental parameters. 23,28 According to García, 23 either viscoelasticity or adhesion has its own unique features in the E * dis vs. A/A 0 and dE * dis /d(A/A 0 ) vs. A/A 0 curves.…”

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Length scale of mechanical heterogeneity in a glassy polymer determined by atomic force microscopy

Wang¹,

Liu²,

Nishi³

et al. 2012

Appl. Phys. Lett.

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“…Nonetheless, in many real situations these contributions cannot be neglected, especially in air environments where the total energy dissipation cannot be assumed to come exclusively from viscoelasticity and where conservative interactions can lead to undesirable phenomena such as snap to contact and can introduce inaccuracies in the calculations using the above formulas. 40 To further address this issue we end our discussion with the inclusion of long range attractive forces in our simulations (see Fig. 6).…”

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confidence: 99%

Calculation of standard viscoelastic responses with multiple retardation times through analysis of static force spectroscopy AFM data

López-Guerra

Eslami

Solares

2017

J Polym Sci B Polym Phys

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We explore the physics of an atomic force microscopy (AFM) cantilever tip interacting with a generalized viscoelastic sample containing an arbitrary number of characteristic times, when the cantilever's base is driven with constant velocity toward the sample. This mode of operation, often called static force spectroscopy (SFS), can be harnessed to thoroughly analyze time-dependent viscoelastic information frequently overlooked in experiments. We generalize the solution of previous authors who have studied the standard linear solid model, and offer a solution applicable to any linear viscoelastic model. This generalization is crucial for the prediction of the model's response over wide ranges of time-scale. As a demonstration, successful predictions of harmonic functions (e.g., loss tangent) over a wide frequency range are obtained through analysis of simulated SFS results. In addition, we show that analysis through the generalized solution and previous expressions is no longer valid when the force does not grow linearly in time, so we also deliver an alternate route for extracting the viscoelastic information, which does not rely on the force linearity assumption. Despite the large amount of theoretical content (included for theoretical rigor's sake), the practical user can also benefit from the new procedures offered and the corresponding explanations.

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Characterization of Surface Viscoelasticity and Energy Dissipation in a Polymer Film by Atomic Force Microscopy

Cited by 43 publications

References 48 publications

Fast nanomechanical spectroscopy of soft matter

Fast nanomechanical spectroscopy of soft matter

Length scale of mechanical heterogeneity in a glassy polymer determined by atomic force microscopy

Calculation of standard viscoelastic responses with multiple retardation times through analysis of static force spectroscopy AFM data

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