Characterization of surface oxide layers formed on FeAl alloys by annealing under different atmospheres

Suzuki, Shigeru; Yamamoto, Taiki; Shinoda, Kōzō; Sato, Sadao

doi:10.1002/sia.2635

Cited by 13 publications

(10 citation statements)

References 11 publications

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“…The thickness values obtained from the XPS depth profiles were con-sidered to be overestimated because it resulted from the difference in sputtering rate between SiO 2 and Al 2 O 3 . Comparing the thickness values with those of Fe-Al alloys in previous studies [7], the present results obtained via ellipsometry appear to be reasonable. Figure 9 shows the CL spectra from aluminum oxide films formed on surfaces of FeCo-V alloys with different aluminum contents.…”

Section: Ellipsometry and CLsupporting

confidence: 89%

“…The oxidation of a specific element at high temperature is regarded as a process to form an insulated oxide thin film on the surfaces of alloys under controlled annealing conditions [6]. Typically, aluminum oxide thin films are formed on the surfaces of Fe-Al alloys, and they are analyzed using a few techniques [7,8]. The annealing atmosphere is changed with different partial pressures of oxygen, which are controlled by H2O/H2 ratios in the gas.…”

Section: Introductionmentioning

confidence: 99%

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Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Kasuya

Imashuku

Wagatsuma

et al. 2020

e-J. Surf. Sci. Nanotechnol.

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X-ray photoelectron spectroscopy (XPS), ellipsometry, and cathode luminescence were utilized for characterizing oxide films formed on the surfaces of FeCo-V alloys (Permendur) that contained small amounts of aluminum via annealing under a low partial pressure of oxygen. XPS spectra showed that the oxide films were composed primarily of aluminum oxide, which was a result of preferential oxidation of aluminum on the surfaces of the alloys during annealing. The thicknesses of the oxide films were estimated from XPS depth profiles coupled with the sputtering rate of a SO2/Si film, and the thicknesses were compared with those of the oxide films measured via non-destructive ellipsometry. The thicknesses obtained from the depth profiles may have been overestimated because of a difference in sputtering rate between silicon oxide and aluminum oxide. As measured via ellipsometry, the thickness of the aluminum oxide thin film, which was less than 100 nm, increases with the aluminum content in the alloys. Wide XPS spectra from the sample surfaces with different roughness suggested that the aluminum oxide thin films were homogenously formed on the smooth surfaces, whereas metallic elements in the alloy substrates were detected on the rough surfaces. Furthermore, the electrical resistivity of the alloys with the smooth surfaces increases significantly with the aluminum content, which may be attributable to the formation of the aluminum oxide thin film. These results indicate that the addition of a small amount of aluminum and surface smoothness are important for controlling formation of the aluminum oxide thin films with high resistivity in FeCo-V alloys by annealing under a low partial pressure of oxygen.

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Section: Ellipsometry and CLsupporting

confidence: 89%

Section: Introductionmentioning

confidence: 99%

Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Kasuya

Imashuku

Wagatsuma

et al. 2020

e-J. Surf. Sci. Nanotechnol.

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“…2). [8] This result highlights that the Mg concentration at the surface is limited by the Mg diffusion and that kinetic laws can be applied. Diffusion coefficient was not determined in this study.…”

Section: Xps Surface Compositionmentioning

confidence: 93%

Investigation on the magnesium segregation in low‐magnesium aluminium alloys

Guillot¹,

Valle²,

Maitre³

et al. 2010

Surface & Interface Analysis

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“…So far, it has been reported that reactive elements such as Si, Mn and Al are oxidized on the surface of Fe based alloys on annealing under various conditions. 5,[8][9][10][11] Conventional surface analytical methods such as X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were used in these studies. It has been shown in these studies that the oxide layers of reactive elements like Si and Al cover the surfaces of these Fe based alloys under low partial pressure of oxygen, 5,10) and these oxide layers must change the surface properties of the Fe based alloys.…”

Section: Introductionmentioning

confidence: 99%

Characterization of Selective Oxidation of Manganese in Surface Layers of Fe–Mn Alloys by Different Analytical Methods

2013

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Since selective oxidation of alloying elements on the surface of steel products influences their surface properties, characterization of the surface oxides which can be considered as non-metallic inclusions is of great importance. In this study, X-ray photoelectron spectroscopy (XPS), X-ray diffractometry (XRD) and Xray absorption spectroscopy (XAS) were used for characterizing the formation process of Mn oxides on the surface of annealed Fe-Mn alloys under a low partial pressure of oxygen. The results obtained by XPS showed that the enrichment and oxidation of Mn occurs on the surface of the Fe-Mn alloys annealed under low oxygen partial pressure, and Mn oxides are formed in the metallic Fe matrix in the surface layers. XAS spectra using grazing-exit X-ray fluorescence measurements showed depth-resolved information on chemical state of Mn. These Mn oxides were identified as MnO (manganosite) by grazing-incident XRD measurements. It was found using in situ XRD measurements at high temperatures that the lattice constant of MnO increased with increasing annealing temperature, which attributed to the non-stoichiometry of MnO. These oxidation characteristics of Mn in the Fe-Mn alloys are discussed on the basis of thermochemical properties of Mn.KEY WORDS: selective oxidation; X-ray photoelectron spectroscopy; X-ray diffraction; X-ray absorption spectroscopy.

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Characterization of surface oxide layers formed on FeAl alloys by annealing under different atmospheres

Cited by 13 publications

References 11 publications

Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Investigation on the magnesium segregation in low‐magnesium aluminium alloys

Characterization of Selective Oxidation of Manganese in Surface Layers of Fe–Mn Alloys by Different Analytical Methods

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