Characterization of Structural Defects in (Cd,Zn)Te Crystals Grown by the Travelling Heater Method

Abstract

Structural defects and compositional uniformity remain the major problems affecting the performance of (Cd, Zn)Te (CZT) based detector devices. Understanding the mechanism of growth and defect formation is therefore fundamental to improving the crystal quality. In this frame, space experiments for the growth of CZT by the Travelling Heater Method (THM) under microgravity are scheduled. A detailed ground-based program was performed to determine experimental parameters and three CZT crystals were grown by the THM. The structural defects, compositional homogeneity and resistivity of these ground-based crystals were investigated. A ZnTe content variation was observed at the growth interface and a high degree of stress associated with extensive dislocation networks was induced, which propagated into the grown crystal region according to the birefringence and X-ray White Beam Topography (XWBT) results. By adjusting the growth parameters, the ZnTe variations and the resulting stress were efficiently reduced. In addition, it was revealed that large inclusions and grain boundaries can generate a high degree of stress, leading to the formation of dislocation slip bands and subgrain boundaries. The dominant defects, including grain boundaries, dislocation networks and cracks in the interior of crystals, led to the resistivity variation in the crystals. The bulk resistivity of the as-grown crystals ranged from 109 Ωcm to 1010 Ωcm.

Bridgman-Grown (Cd,Mn)Te and (Cd,Mn)(Te,Se): A Comparison of Suitability for X and Gamma Detectors

“…A test was conducted to examine whether higher hardness values translate into a smaller population of sub-grain boundaries, which are often encountered in CdTe-based compounds produced using the Bridgman method and pose a significant issue in detector performance. Typically, sub-grain boundaries are investigated using the White Beam X-ray Diffraction Tomography method [ 8 , 62 , 63 , 64 , 65 , 66 ]. We employed an etching method to reveal etch pits using the Inoue solution, as the Nakagawa solution [ 67 ] yielded no results on our samples.…”