2005
DOI: 10.1149/1.1867652
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Characterization of SEI Layers on LiMn[sub 2]O[sub 4] Cathodes with In Situ Spectroscopic Ellipsometry

Abstract: In situ spectroscopic ellipsometry was employed to study the initial stage of solid electrolyte interphase ͑SEI͒ layer formation on thin-film LiMn 2 O 4 electrodes. The SEI layer formed immediately upon exposure of the electrode to ethylene carbonate/dimethyl carbonate ͑1:1 by vol͒ 1.0 M LiPF 6 electrolyte. The SEI layer thickness then increased in proportion to a logarithmic function of elapsed time. In comparison, the SEI layer thickness on a cycled electrode increased in proportion to a linear function of t… Show more

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Cited by 87 publications
(75 citation statements)
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“…6), suggesting gradual SEI growth during cycling. The SEI thickness obtained in this study by indentation was thicker than the reported values measured by other techniques, such as ellipsometry and TEM, 9,11,22 which reported that the SEI thickness was in the range of 2-5 nm, much smaller than the result in this study. The relatively thin SEI from TEM measurements probably appears because of SEI decomposition by the focused electron beam under high vacuum condition, 10 while the ellipsometry technique seems to underestimate the thickness due to an assumption of an optically homogeneous and isotropic SEI.…”
contrasting
confidence: 83%
“…6), suggesting gradual SEI growth during cycling. The SEI thickness obtained in this study by indentation was thicker than the reported values measured by other techniques, such as ellipsometry and TEM, 9,11,22 which reported that the SEI thickness was in the range of 2-5 nm, much smaller than the result in this study. The relatively thin SEI from TEM measurements probably appears because of SEI decomposition by the focused electron beam under high vacuum condition, 10 while the ellipsometry technique seems to underestimate the thickness due to an assumption of an optically homogeneous and isotropic SEI.…”
contrasting
confidence: 83%
“…The samples were taken out of electrolyte, cleaned thoroughly with IPA, deionized water using ultrasonic procedures and investigated using a Spectroscopic ellipsometry setup described elsewhere. [19] Each data point in Figure 2 corresponds to an independent single sample/cell that has been in contact with electrolyte. Ellipsometry measurements were implemented at least twice on each sample on a different surface area on both sides.…”
Section: Methodsmentioning
confidence: 99%
“…[9][10][11][12][13][14] In typical experiments, the amplitude ratio ( ) and the phase difference ( ) are used to describe the orientation of the reflected light based on Fresnel amplitude reflection coefficients. As the optical properties and thicknesses of surface films change, so do and .…”
mentioning
confidence: 99%
“…[3][4][5][6][7][8] Spectroscopic ellipsometry (SE), by following changes in the polarization of light as it interacts with surface films, provides an in situ route to follow thickness changes in the SEI. [9][10][11][12][13][14] In typical experiments, the amplitude ratio ( ) and the phase difference ( ) are used to describe the orientation of the reflected light based on Fresnel amplitude reflection coefficients. As the optical properties and thicknesses of surface films change, so do and .…”
mentioning
confidence: 99%