Characterization of Second Generation Advanced Dynamic Pyroelectric Focal Plane Array

Abstract

The pyroelectric effect has been characterized for single-pixel elements consisting of strontium bismuth tantalate (SBT) ferroelectric material as the sensing element. The pixels include also a thermal insulating layer and an infrared (IR) absorber layer. These MEMS-less devices are operated in active mode, a technique that eliminates the need for a radiation chopper found in passive pyroelectric IR imagers. Test results of the SBT pixels of dimensions 7.5 µm × 7.5 µm to 200 µm × 200 µm have shown high endurance to polar cycling, high responsivity values, and very low noise-equivalent temperature difference for focal plane array applications. This paper describes and analyses the results of precursor 2 × 2 arrays using discrete sensing elements, the active detection mechanism, and its unique read-out electronics. A second-generation 32 × 32 pixels array being implemented to demonstrate the performance of a 1k-pixel array as precursor to larger size arrays is also described. The active mode detection, in addition to eliminating the use of a chopper, enables the dynamic partition of the array into pixel domains in which the pixel sensitivities in each domain can be adjusted independently. This unique feature in IR detection is not readily found in other types of IR imagers and can be applied to the simultaneous tracking of diverse contrast objects. By controlling the absorber material thickness, the arrays can be optimized for maximum response at specified wavelengths by means of quarter-wavelength interferometric technique.