Characterization of near-field emission and structure of an SLD by polarization parametric indirect microscopic imaging
Bin Ni,
Wei Chen,
Shengwei Ye
et al.
Abstract:In this paper, a novel polarization parametric indirect microscopic imaging (PIMI) method is utilized for the first time to characterize the near-field emission mode and end-face structure of nanoscale semiconductor light-emitting chips. Via polarization modulation and detection of the emitted light from an SLD chip, abundant information including the distinct border of the emission mode, which cannot be seen by the traditional method, is collected and visualized as the form of multi-dimensional photon state d… Show more
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