2011
DOI: 10.1016/j.tsf.2010.11.058
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Characterization of nano-structured W-, Ti-, V-, and Zr-doped carbon films

Abstract: Bonding structure of carbon and metal as well as nanostructural changes of metal-doped amorphous carbon films (a-C:Me) were investigated depending on metal type (W, Ti, V, Zr), concentration (<25 at%) and annealing temperature (<1300 K, except W: <2800 K).Pure C films exhibit ~2 nm distorted aromatic and graphene-like regions. Both increase in size with annealing. After deposition the metals have carbide-like bonding and are mainly distributed atomically disperse in an amorphous environment. Annealing leads to… Show more

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Cited by 2 publications
(1 citation statement)
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“…One possible explanation is that the remaining carbon originates from the initial tungsten-carbon chemical bonding in the a-C:W film. Although at low deposition temperature no tungsten carbide crystal is formed in asdeposited a-C:W films, carbide bonds were shown to be the dominant chemical bonding structure of tungsten in a-C:W films [13,[24][25]. It is quite probable that not all carbon in the W-rich layer can be removed by chemical erosion under the conditions of our experiment.…”
Section: Chemical State and Depth Profilementioning
confidence: 92%
“…One possible explanation is that the remaining carbon originates from the initial tungsten-carbon chemical bonding in the a-C:W film. Although at low deposition temperature no tungsten carbide crystal is formed in asdeposited a-C:W films, carbide bonds were shown to be the dominant chemical bonding structure of tungsten in a-C:W films [13,[24][25]. It is quite probable that not all carbon in the W-rich layer can be removed by chemical erosion under the conditions of our experiment.…”
Section: Chemical State and Depth Profilementioning
confidence: 92%