Characterization of MOS Varactors in 40 nm CMOS Technology at 77 K and 4 K

Liou, Fang-Chuan; Huang, Tzuen-Hsi

doi:10.1109/apmc57107.2023.10439860

2023 Asia-Pacific Microwave Conference (APMC) 2023

DOI: 10.1109/apmc57107.2023.10439860

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Characterization of MOS Varactors in 40 nm CMOS Technology at 77 K and 4 K

Fang-Chuan Liou,

Tzuen-Hsi Huang

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Characterization of MOS Varactors in 40 nm CMOS Technology at 77 K and 4 K

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References 7 publications

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