2002
DOI: 10.1016/s0168-583x(01)01081-3
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Characterization of metal threads using differential PIXE analysis

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Cited by 34 publications
(29 citation statements)
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“…Recently, in order to overcome some of these difficulties, more sensitive analytical techniques like AES, XPS, SIMS and laser-ICP/ MS have been used, and to our knowledge, few characterization studies by using IBA methods have been done so far [5][6][7][8]. Elemental analysis either on surface or in a depth profile by IBA methods are non-destructive and could provide unique information at the trace level sensitivity which make them ideal for the study of the very small and thin, possibly multilayered metal threads.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, in order to overcome some of these difficulties, more sensitive analytical techniques like AES, XPS, SIMS and laser-ICP/ MS have been used, and to our knowledge, few characterization studies by using IBA methods have been done so far [5][6][7][8]. Elemental analysis either on surface or in a depth profile by IBA methods are non-destructive and could provide unique information at the trace level sensitivity which make them ideal for the study of the very small and thin, possibly multilayered metal threads.…”
Section: Introductionmentioning
confidence: 99%
“…PIXE provides multielemental, simultaneous analysis of elements with atomic number ranging from Z = 11 (Sodium) to Z = 92 (Uranium), with lower limits of detection down to the few lg/g range. However, novel methodologies reported for the PIXE analysis (3D Micro-PIXE [17], differential PIXE [18][19][20][21][22]) can also contribute towards elemental profiling studies up to a depth of several tens of lm. RBS can provide quantitative information of most elements in a near-surface region that it is either structured as a sequence of layers with different composition and thickness or presenting elemental concentration gradients due to the selective depletion or enrichment of particular elements including those with low atomic number (such as oxygen and carbon).…”
Section: Development Of the External Ion Beam Set-upmentioning
confidence: 99%
“…For instance, a PIXE study of pottery recovered from a renaissance shipwreck in Italy determined the amount of 23 elements on a range of samples [Zucchiati et al, 1998]. 6.5.6 Metals PIXE is widely used for the study of metal objects, particularly coins [Demortier, 1988[Demortier, , 1992[Demortier, , 2004Demortier and Ruvalcaba, 2005;Denker and Blaich, 2002;Denker et al, 2005;Enguita et al, 2002;Flament and Marchetti, 2004;Guerra, 2000;Guerra and Calligaro, 2003;Johanssen et al, 1986;Linke et al, 2004b;Smit et al, 2005b]. 6.5.5 Stone PIXE and PIGE have been applied to the characterisation of precious stones [Bellot-Gurlet et al, 2005;Calligaro et al, 1998Calligaro et al, , 2002Calligaro et al, , 2003Chen et al, 2004;Constantinescu et al, 2002;Dran et al, 2000;Kim et al, 2003;Pappalardo et al, 2005;Querre et al, 1996].…”
Section: Ceramicsmentioning
confidence: 99%