2000
DOI: 10.1116/1.582210
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Characterization of magnesium fluoride thin films deposited by direct electron beam evaporation

Abstract: Magnesium fluoride films have been deposited on quartz and silicon substrates by direct electron beam evaporation. The structure, composition, and mass density of films were investigated as functions of the deposition temperature ranging from ambient temperature to 300 °C. The composition of films determined by infrared spectroscopy, and the residual stresses in films calculated from the change of the radius of curvature of Si substrates, were studied as functions of the aging time of films in room air and dep… Show more

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Cited by 33 publications
(28 citation statements)
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“…Figure 5 (b) shows that density of MgF 2 films increased with substrate temperature from ∼81% of bulk density (3.16 g/cm −3 ) for the film deposited at room temperature up to ∼100% of bulk density for the films deposited at 250°C. This result is compatible with those reported in Ref [9]. Density increase must be due to a reduction of voids in the film, leaving less room for water and contaminants and thus reducing MgF 2 extinction coefficient values as reported by Wood II et al [12].…”
Section: Density Roughness and Pinholessupporting
confidence: 93%
See 1 more Smart Citation
“…Figure 5 (b) shows that density of MgF 2 films increased with substrate temperature from ∼81% of bulk density (3.16 g/cm −3 ) for the film deposited at room temperature up to ∼100% of bulk density for the films deposited at 250°C. This result is compatible with those reported in Ref [9]. Density increase must be due to a reduction of voids in the film, leaving less room for water and contaminants and thus reducing MgF 2 extinction coefficient values as reported by Wood II et al [12].…”
Section: Density Roughness and Pinholessupporting
confidence: 93%
“…Yet, the absorption of thin films of MgF 2 in the transparency range is several orders of magnitude higher than in MgF 2 crystals, and this absorption increases towards the cut-off wavelength. The absorption in thin films deposited by evaporation is related with the columnar growth that leaves room for water and contaminants [9]; columnar growth also generates scattering losses [10,11]. All this limits Al/MgF 2 mirror reflectance.…”
Section: Introductionmentioning
confidence: 99%
“…3(a), the stress transformed from compressive stress into tensile stress which mainly originated from thermal stress due to the difference in thermal expansion coefficient between the films and the substrate. The compress tensile of the films prepared at room temperature was thought to be related to the reaction between the adsorbed water molecules and the inner face of the pores [10]. The tensile stress increased with the deposition rate as shown in Fig.…”
Section: Film Characterizationmentioning
confidence: 96%
“…When the MgF 2 film grows on a substrate at room temperature (RT), it grows more absorbing and more porous than bulk MgF 2 crystals, which is a source of light scattering and causes the presence of contaminants, starting with water vapor, to fill the pores. The absorption in thin films deposited by evaporation is related with the columnar growth [2]. Both scattering and absorption result in a lower reflectance of the Al/MgF 2 coating.…”
Section: Introductionmentioning
confidence: 99%